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Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.
Le Jin
Kumar L. Parthasarathy
Turker Kuyel
Degang Chen
Randall L. Geiger
Published in:
ITC (2003)
Keyphrases
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circuit design
mixed signal
test cases
precision and recall
non stationary
data conversion
low power
data sets
multi channel
printed circuit
analog vlsi
complementarity problems
piecewise linear
average precision
test data
signal processing
face recognition
image processing