Shalabh Goyal

Publication Activity (10 Years)

Years Active: 2004-2009
Publications (10 Years): 0

Publications

Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium (2009)
Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS (2009)
Shalabh Goyal, Abhijit Chatterjee
Linearity Testing of A/D Converters Using Selective Code Measurement. J. Electron. Test. 24 (6) (2008)
Shalabh Goyal, Abhijit Chatterjee, Michael Purtell
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electron. Test. 23 (1) (2007)
Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS (2006)
Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh
Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. ATS (2006)
Shalabh Goyal, Abhijit Chatterjee, Mike Atia
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. ETS (2006)
Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag
Test time reduction of successive approximation register A/D converter by selective code measurement. ITC (2005)
Shalabh Goyal, Michael Purtell
Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. Asian Test Symposium (2005)
Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium (2004)