A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.
Shalabh GoyalAbhijit ChatterjeeMichael PurtellPublished in: J. Electron. Test. (2007)
Keyphrases
- low cost
- high speed
- test data
- synthetic data
- data sets
- data analysis
- prior knowledge
- data acquisition
- missing data
- data collection
- raw data
- database
- probability distribution
- user defined
- data processing
- association rules
- high quality
- high level
- data mining techniques
- original data
- statistical tests
- test case generation
- experimental data
- spatial data
- test set
- knowledge discovery
- data sources
- xml documents
- data streams
- real time