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Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.
Sehun Kook
Hyun Woo Choi
Vishwanath Natarajan
Abhijit Chatterjee
Alfred V. Gomes
Shalabh Goyal
Le Jin
Published in:
Asian Test Symposium (2009)
Keyphrases
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high precision
low cost
high recall
high reliability
achieve high precision
dynamic environments
high accuracy
dynamically changing
hardware and software
low power
test cases
conceptual framework
test data
database
face recognition
website
image processing
information systems
real time