Hyun Woo Choi

Publication Activity (10 Years)

Years Active: 2007-2019
Publications (10 Years): 2

Top Topics

Statistically Independent

Signal Reconstruction

Top Venues

J. Electron. Test.

Asian Test Symposium

Publications

Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. J. Electron. Test. 35 (6) (2019)
Nicholas Tzou, Debesh Bhatta, Xian Wang, Te-Hui Chen, Sen-Wen Hsiao, Barry J. Muldrey, Hyun Woo Choi, Abhijit Chatterjee
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. (6) (2016)
Thomas Moon, Hyun Woo Choi, Nicholas Tzou, Abhijit Chatterjee
Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms. IEEE Trans. Signal Process. 63 (24) (2015)
David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo
An FPGA-based ATE extension module for low-cost multi-GHz memory test. ETS (2015)
Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware. J. Electron. Test. 31 (1) (2015)
Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS (2014)
Hyun Woo Choi, Thomas Moon, Abhijit Chatterjee
Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery. IEEE Trans. Instrum. Meas. 63 (12) (2014)
Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium (2013)
Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee
Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. IEEE Trans. Very Large Scale Integr. Syst. 21 (3) (2013)
Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling. VTS (2013)
Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28 (4) (2012)
Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee
Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. ITC (2012)
Debesh Bhatta, Nicholas Tzou, Hyun Woo Choi, Abhijit Chatterjee
Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving. Asian Test Symposium (2012)
Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. ITC (2012)
Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. VTS (2012)
Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. ITC (2012)
David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo
Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. ITC (2012)
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (7) (2012)
Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. VTS (2012)
Hyun Woo Choi, Alfred V. Gomes, Abhijit Chatterjee
Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. IEEE Trans. Very Large Scale Integr. Syst. 19 (7) (2011)
Hyun Woo Choi, Abhijit Chatterjee
Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling. Asian Test Symposium (2010)
Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium (2010)
Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD (2009)
Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium (2009)
Hyun Woo Choi, Abhijit Chatterjee
Digital bit stream jitter testing using jitter expansion. DATE (2008)
Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. ETS (2008)
Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC (2008)
Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee
Enhanced Resolution Jitter Testing Using Jitter Expansion. VTS (2007)