Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements.
Sehun KookHyun Woo ChoiAbhijit ChatterjeePublished in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
- higher resolution
- low resolution
- high resolution
- active appearance models
- lower resolution
- super resolution
- multiresolution
- higher quality
- low resolution images
- resolution enhancement
- face images
- high quality
- high resolution images
- post processing
- depth map
- image reconstruction
- high frequency
- geometric structure
- image pixels
- data sets
- input image
- image processing