Soumendu Bhattacharya

Publication Activity (10 Years)

Years Active: 1993-2013
Publications (10 Years): 0

Top Venues

LATW

Georgia Institute of Technology, Atlanta, GA, USA (PHD)

Education History

Georgia Institute of Technology, Atlanta, GA, USA

PHD

Publications

Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW (2013)
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29 (1) (2012)
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (7) (2012)
Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design (2011)
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS (2010)
Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD (2009)
Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. IEEE Trans. Very Large Scale Integr. Syst. 17 (6) (2009)
Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS (2008)
Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 16 (3) (2008)
Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2007)
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS (2007)
Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1 (3) (2007)
Soumendu Bhattacharya, Sankar Nair, Abhijit Chatterjee
An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. IEEE Trans. Circuits Syst. I Regul. Pap. (11) (2006)
Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS (2006)
Soumendu Bhattacharya, Abhijit Chatterjee
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23 (6) (2006)
Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS (2006)
Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design (2006)
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS (2006)
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. ETS (2006)
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW (2006)
Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS (2005)
Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21 (3) (2005)
Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design (2005)
Soumendu Bhattacharya, Abhijit Chatterjee
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS (2005)
Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. ITC (2005)
Soumendu Bhattacharya, Abhijit Chatterjee
Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10 (2) (2005)
Soumendu Bhattacharya, Abhijit Chatterjee
Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC (2004)
Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE (2004)
Soumendu Bhattacharya, Abhijit Chatterjee
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium (2004)
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS (2004)
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA (2004)
Soumendu Bhattacharya, Abhijit Chatterjee
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS (2003)
Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC (2003)
Soumendu Bhattacharya, Abhijit Chatterjee
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA (2002)
Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya
Visualization in linear programming using parallel coordinates. Pattern Recognit. 26 (11) (1993)

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Publication Activity (10 Years)

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Soumendu Bhattacharya