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A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits.
Soumendu Bhattacharya
Abhijit Chatterjee
Published in:
Asian Test Symposium (2004)
Keyphrases
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delay insensitive
real time
logic synthesis
high speed
asynchronous circuits
built in self test
sensor networks
embedded systems
analog circuits
quantum computing
lateral inhibition
neural network
low cost
multi sensor
analog vlsi
vlsi circuits