Ganesh Srinivasan

Publication Activity (10 Years)

Years Active: 2004-2020
Publications (10 Years): 1

Top Topics

Technological Advances

Intensive Care Units

Top Venues

Publications

Kenny Hong, Yumiko Sakamoto, Ganesh Srinivasan, Pourang Irani
Exploring technology for neonatal resuscitation training. AH (2020)
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (7) (2012)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27 (3) (2011)
Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design (2011)
Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26 (4) (2010)
Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27 (6) (2010)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC (2010)
Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium (2010)
Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC (2008)
Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. ITC (2008)
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. 25 (2) (2008)
Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. VTS (2007)
Ganesh Srinivasan, Abhijit Chatterjee, Vishwanath Natarajan
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources. ATS (2007)
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE (2006)
Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS (2006)
Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee
On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. IOLTS (2006)
Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21 (3) (2005)
Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS (2005)
Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design (2005)
Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium (2004)
Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE (2004)
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS (2004)
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA (2004)