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Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.

Vishwanath NatarajanHyun Woo ChoiAritra BanerjeeShreyas SenAbhijit ChatterjeeGanesh SrinivasanFriedrich TaenzlerSoumendu Bhattacharya
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
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