Friedrich Taenzler

Publication Activity (10 Years)

Years Active: 1993-2014
Publications (10 Years): 0

Top Topics

Built In Self Test

Management System

Top Venues

J. Electron. Test.

Publications

Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian
A novel BIST technique for LDMOS drivers. MWSCAS (2014)
Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao
Development and empirical verification of an accuracy model for the power down leakage tests. VTS (2014)
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
Physics Based Fault Models for Testing High-Voltage LDMOS. VLSI Design (2013)
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29 (6) (2013)
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (7) (2012)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27 (3) (2011)
Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27 (6) (2010)
Abhijit Chatterjee, Friedrich Taenzler
Low cost test and tuning of RF circuits and systems. VTS (2010)
Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC (2008)
Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. ITC (2008)
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. 25 (2) (2008)
Friedrich Taenzler
Production Test of High Volume Commercial RFIC. ATS (2007)
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE (2006)
Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS (2006)
Friedrich Taenzler, Thomas Novak, Erich Kubalek
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. VTS (1993)