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Physics-Based Low-Cost Test Technique for High Voltage LDMOS.

Sukeshwar KannanKaushal KannanBruce C. KimFriedrich TaenzlerRichard AntleyKen MoushegianKenneth M. ButlerDoug Mirizzi
Published in: J. Electron. Test. (2013)
Keyphrases
  • high voltage
  • low cost
  • operating conditions
  • real time
  • normal operation
  • data sets
  • artificial intelligence
  • decision making
  • management system
  • deformable models
  • single chip