Sukeshwar Kannan

Publication Activity (10 Years)

Years Active: 2009-2022
Publications (10 Years): 13

Top Topics

Integrated Circuit

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

J. Electron. Test.

ACM J. Emerg. Technol. Comput. Syst.

Publications

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18 (1) (2022)
Nicholas C. Harris, Ryan Braid, Darius Bunandar, Jim Carr, Brad Dobbie, Carlos Dorta-Quinones, Jon Elmhurst, Martin Forsythe, Michael Gould, Shashank Gupta, Sukeshwar Kannan, Tyler Kenney, Gary Kong, Tomo Lazovich, Scott Mckenzie, Carl Ramey, Chithira Ravi, Michael Scott, John Sweeney, Ozgur Yildirim, Katrina Zhang
Accelerating Artificial Intelligence with Silicon Photonics. OFC (2020)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (10) (2019)
Arjun Chaudhuri, Sukeshwar Kannan, Luke England, Jack Golz
Compact Scalable Dynamic TSV IR Drop Compensation for Power Delivery in 3D Packages. MWSCAS (2019)
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
Prebond Testing and Test-Path Design for the Silicon Interposer in 2.5-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (8) (2017)
Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg, Mark M. Tehranipoor
SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (5) (2017)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
A Design-for-Test Solution for Monolithic 3D Integrated Circuits. ICCD (2017)
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 13 (4) (2017)
Mehdi Sadi, Sukeshwar Kannan, Luke England, Mark M. Tehranipoor
Design of a digital IP for 3D-IC die-to-die clock synchronization. ISCAS (2017)
Ran Wang, Zipeng Li, Sukeshwar Kannan, Krishnendu Chakrabarty
Pre-bond testing of the silicon interposer in 2.5D ICs. DATE (2016)
Sukeshwar Kannan, Mehdi Sadi, Luke England
Power delivery in 3D packages: current crowding effects, dynamic IR drop and compensation network using sensors (invited paper). ICCAD (2016)
Luke England, Sukeshwar Kannan, Rahul Agarwal, Daniel Smith
Impact of TSV integration on 14nm FinFET device performance. 3DIC (2016)
Sukeshwar Kannan, Rahul Agarwal, Arnaud Bousquet, Geetha Aluri, Hui-Shan Chang
Device performance analysis on 20nm technology thin wafers in a 3D package. IRPS (2015)
Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho
Development of hybrid electrical model for CNT based Through Silicon Vias. ISCAS (2013)
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
Physics Based Fault Models for Testing High-Voltage LDMOS. VLSI Design (2013)
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29 (6) (2013)
Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. J. Electron. Test. 28 (1) (2012)
Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn
Analysis of propagation delay in 3 - D stacked DRAM. ISCAS (2012)
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho
Modeling and characterization of CNT-based TSV for high frequency applications. ISCAS (2012)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27 (3) (2011)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC (2010)
Sukeshwar Kannan, Bruce C. Kim
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. ITC (2009)