FAULT MODELS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Kewal K. Saluja
- Sreejit Chakravarty
- Ilia Polian
- Vishwani D. Agrawal
- Janak H. Patel
- W. Kent Fuchs
- Kuen-Jong Lee
- Bernd Becker
- Srikanth Venkataraman
- Franz Wotawa
- Premachandran R. Menon
- Said Hamdioui
- Wolfgang Nejdl
- Gerhard Friedrich
- Luca Console
- John P. Hayes
- Serge Pravossoudovitch
- Abhijit Chatterjee
- Raimund Ubar
- Ad J. van de Goor
- Yoshinobu Higami
- Patrick Girard
- Santosh Biswas
- Wu-Tung Cheng
- Hafizur Rahaman
- Bhargab B. Bhattacharya
- Hiroshi Takahashi
- Rolf Drechsler
- Sun-Yuan Hsieh
- Yuzo Takamatsu
- Gregory M. Provan
- Michele Favalli
- Kozo Kinoshita
- Jaan Raik
- Kwang-Ting Cheng
- Dipak Kumar Kole
- Daniele Theseider Dupré
Venues
- ITC
- CoRR
- IEEE Trans. Computers
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- Asian Test Symposium
- VLSI Design
- ICCAD
- J. Electron. Test.
- DAC
- DATE
- ECAI
- AAAI
- IEEE Trans. Ind. Electron.
- DSD
- IOLTS
- IEEE Trans. Very Large Scale Integr. Syst.
- ASP-DAC
- ATS
- DFT
- IEEE Access
- IJCAI
- DDECS
- IEEE Des. Test Comput.
- ICCD
- ETS
- IEA/AIE
- EWDTS
- IEICE Trans. Inf. Syst.
- Artif. Intell.
- ISCAS
- IEEE Trans. Instrum. Meas.
- IACR Cryptol. ePrint Arch.
- UAI
- J. Artif. Intell. Res.
- ACC
- J. Circuits Syst. Comput.
- Systems and Computers in Japan
- EURO-DAC
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