FAULT MODELS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Kewal K. Saluja
- Sreejit Chakravarty
- Vishwani D. Agrawal
- Ilia Polian
- Janak H. Patel
- W. Kent Fuchs
- Srikanth Venkataraman
- Kuen-Jong Lee
- Bernd Becker
- Said Hamdioui
- Franz Wotawa
- Premachandran R. Menon
- Yoshinobu Higami
- Santosh Biswas
- Raimund Ubar
- Wolfgang Nejdl
- Wu-Tung Cheng
- Gerhard Friedrich
- Patrick Girard
- Serge Pravossoudovitch
- Luca Console
- Ad J. van de Goor
- Abhijit Chatterjee
- John P. Hayes
- Gregory M. Provan
- Bhargab B. Bhattacharya
- Kozo Kinoshita
- Hiroshi Takahashi
- Sun-Yuan Hsieh
- Hafizur Rahaman
- Yuzo Takamatsu
- Michele Favalli
- Rolf Drechsler
- Dipak Kumar Kole
- Daniele Theseider Dupré
- Jaan Raik
- Kwang-Ting Cheng
Venues
- ITC
- IEEE Trans. Computers
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- Asian Test Symposium
- VLSI Design
- J. Electron. Test.
- ICCAD
- DAC
- ECAI
- DATE
- IOLTS
- AAAI
- ATS
- DSD
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Ind. Electron.
- ASP-DAC
- DFT
- DDECS
- IEEE Access
- ICCD
- IJCAI
- IEEE Des. Test Comput.
- IEA/AIE
- EWDTS
- ISCAS
- Artif. Intell.
- IEICE Trans. Inf. Syst.
- IEEE Trans. Instrum. Meas.
- ETS
- ACC
- J. Circuits Syst. Comput.
- J. Artif. Intell. Res.
- UAI
- EURO-DAC
- Systems and Computers in Japan
- ACM Trans. Design Autom. Electr. Syst.
Related Topics
Related Keywords
Popularity