FAULT MODELS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Kewal K. Saluja
- Sreejit Chakravarty
- Vishwani D. Agrawal
- Ilia Polian
- Janak H. Patel
- W. Kent Fuchs
- Srikanth Venkataraman
- Premachandran R. Menon
- Franz Wotawa
- Said Hamdioui
- Bernd Becker
- Kuen-Jong Lee
- Yoshinobu Higami
- Ad J. van de Goor
- Raimund Ubar
- Wu-Tung Cheng
- Santosh Biswas
- Patrick Girard
- Luca Console
- Gerhard Friedrich
- Wolfgang Nejdl
- Abhijit Chatterjee
- Serge Pravossoudovitch
- John P. Hayes
- Kozo Kinoshita
- Michele Favalli
- Gregory M. Provan
- Hafizur Rahaman
- Rolf Drechsler
- Yuzo Takamatsu
- Sun-Yuan Hsieh
- Hiroshi Takahashi
- Bhargab B. Bhattacharya
- Kwang-Ting Cheng
- Jaan Raik
- Daniele Theseider Dupré
- Dipak Kumar Kole
Venues
- ITC
- CoRR
- IEEE Trans. Computers
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- Asian Test Symposium
- VLSI Design
- J. Electron. Test.
- ICCAD
- DAC
- ECAI
- DATE
- IEEE Trans. Ind. Electron.
- AAAI
- IOLTS
- DSD
- ATS
- ASP-DAC
- IEEE Trans. Very Large Scale Integr. Syst.
- DFT
- IEEE Access
- ICCD
- DDECS
- IJCAI
- IEEE Des. Test Comput.
- EWDTS
- IEA/AIE
- ETS
- ISCAS
- Artif. Intell.
- IEICE Trans. Inf. Syst.
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Instrum. Meas.
- J. Circuits Syst. Comput.
- Systems and Computers in Japan
- EURO-DAC
- ACC
- J. Artif. Intell. Res.
- UAI
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