FAULT MODELS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Kewal K. Saluja
- Sreejit Chakravarty
- Ilia Polian
- Vishwani D. Agrawal
- Janak H. Patel
- W. Kent Fuchs
- Franz Wotawa
- Srikanth Venkataraman
- Premachandran R. Menon
- Kuen-Jong Lee
- Bernd Becker
- Said Hamdioui
- Serge Pravossoudovitch
- Luca Console
- Wu-Tung Cheng
- Raimund Ubar
- Ad J. van de Goor
- Yoshinobu Higami
- Gerhard Friedrich
- Abhijit Chatterjee
- Santosh Biswas
- Patrick Girard
- Wolfgang Nejdl
- John P. Hayes
- Sun-Yuan Hsieh
- Kozo Kinoshita
- Michele Favalli
- Rolf Drechsler
- Bhargab B. Bhattacharya
- Yuzo Takamatsu
- Hafizur Rahaman
- Gregory M. Provan
- Hiroshi Takahashi
- Daniele Theseider Dupré
- Jaan Raik
- Kwang-Ting Cheng
- Dipak Kumar Kole
Venues
- ITC
- CoRR
- IEEE Trans. Computers
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- Asian Test Symposium
- VLSI Design
- J. Electron. Test.
- ICCAD
- DAC
- DATE
- ECAI
- IEEE Trans. Ind. Electron.
- AAAI
- IOLTS
- DSD
- ASP-DAC
- IEEE Trans. Very Large Scale Integr. Syst.
- ATS
- IEEE Access
- DFT
- DDECS
- ICCD
- IEEE Des. Test Comput.
- IJCAI
- EWDTS
- IEA/AIE
- ETS
- Artif. Intell.
- IEICE Trans. Inf. Syst.
- IEEE Trans. Instrum. Meas.
- ISCAS
- IACR Cryptol. ePrint Arch.
- EURO-DAC
- J. Circuits Syst. Comput.
- ACC
- J. Artif. Intell. Res.
- UAI
- Systems and Computers in Japan
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