Srikanth Venkataraman

Publication Activity (10 Years)

Years Active: 1995-2022
Publications (10 Years): 16

Top Topics

Fault Detection

Test Generation

Synthetic Datasets

Top Venues

Publications

Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman
Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. ATS (2022)
Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Irith Pomeranz, Srikanth Venkataraman
LFSR-Based Test Generation for Reduced Fail Data Volume. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (12) (2020)
Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman
Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines. DATE (2019)
Irith Pomeranz, Vivek Chickermane, Srikanth Venkataraman
Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults. VTS (2019)
Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman
Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based Design. ACM Trans. Design Autom. Electr. Syst. 24 (4) (2019)
Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC (2018)
Irith Pomeranz, Srikanth Venkataraman
Interconnect-aware tests to complement gate-exhaustive tests. ETS (2018)
Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT (2018)
Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. Very Large Scale Integr. Syst. 25 (4) (2017)
Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. ITC (2017)
Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Test Modification for Reduced Volumes of Fail Data. ACM Trans. Design Autom. Electr. Syst. 22 (4) (2017)
Shraddha Bodhe, M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
Diagnostic Fail Data Minimization Using an N-Cover Algorithm. IEEE Trans. Very Large Scale Integr. Syst. 24 (3) (2016)
Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. VTS (2016)
M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma
A novel diagnostic test generation methodology and its application in production failure isolation. ITC (2016)
M. Enamul Amyeen, Irith Pomeranz, Srikanth Venkataraman
A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction. ATS (2016)
Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen
Built-in generation of functional broadside tests considering primary input constraints. ACM Great Lakes Symposium on VLSI (2014)
Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS (2013)
Srikanth Venkataraman, Nagesh Tamarapalli
Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design (2012)
M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan
Logic BIST silicon debug and volume diagnosis methodology. ITC (2011)
Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Defect diagnosis based on DFM guidelines. VTS (2010)
M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak
Microprocessor system failures debug and fault isolation methodology. ITC (2009)
Richard McLaughlin, Srikanth Venkataraman, Carlston Lim
Automated Debug of Speed Path Failures Using Functional Tests. VTS (2009)
Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman
Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects. ATS (2008)
Srikanth Venkataraman, Nagesh Tamarapalli
DFM / DFT / SiliconDebug / Diagnosis. VLSI Design (2008)
King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman
Diagnosis of Scan Clock Failures. VTS (2008)
Srikanth Venkataraman, Nagesh Nagapalli, Lech Józwiak
Quality Driven Manufacturing and SOC Designs. ISQED (2007)
Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS (2007)
Srikanth Venkataraman
DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield. ISQED (2007)
Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau
Testing for systematic defects based on DFM guidelines. ITC (2007)
Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian
Making Manufacturing Work For You. DAC (2007)
Irith Pomeranz, Sudhakar M. Reddy, Srikanth Venkataraman
z-Diagnosis: A Framework for Diagnostic Fault Simulation and Test Generation Utilizing Subsets of Outputs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (9) (2007)
Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
Extraction error modeling and automated model debugging in high-performance custom designs. IEEE Trans. Very Large Scale Integr. Syst. 14 (7) (2006)
M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman
Improving Precision Using Mixed-level Fault Diagnosis. ITC (2006)
Ruifeng Guo, Srikanth Venkataraman
An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (9) (2006)
Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman
Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. VTS (2006)
Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS (2006)
David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design (2006)
Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS (2006)
Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman
Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. DATE (2005)
Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy
Fault Diagnosis and Fault Model Aliasing. ISVLSI (2005)
Srikanth Venkataraman
Achieving higher yield through diagnosis? ITC (2005)
Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman
Enabling yield analysis with X-compact. ITC (2005)
Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design (2004)
Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy
Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection. ITC (2004)
Srikanth Venkataraman
Diagnosis meets Physical Failure Analysis: What is needed to succeed? ITC (2004)
Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran
Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. VTS (2004)
Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis. DATE (2004)
M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC (2004)
Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS (2004)
Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS (2003)
Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ACM Trans. Design Autom. Electr. Syst. 6 (4) (2001)
Ruifeng Guo, Srikanth Venkataraman
A technique for fault diagnosis of defects in scan chains. ITC (2001)
Ramesh C. Tekumalla, Srikanth Venkataraman, Jayabrata Ghosh-Dastidar
On Diagnosing Path Delay Faults in an At-Speed Environment. VTS (2001)
Srikanth Venkataraman, Scott Brady Drummonds
Poirot: Applications of a Logic Fault Diagnosis Tool. IEEE Des. Test Comput. 18 (1) (2001)
Srikanth Venkataraman, Scott Brady Drummonds
A Technique for Logic Fault Diagnosis of Interconnect Open Defects. VTS (2000)
Srikanth Venkataraman, Scott Brady Drummonds
POIROT: a logic fault diagnosis tool and its applications. ITC (2000)
Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs
Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits. VTS (1999)
Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
Diagnostic Simulation of Sequential Circuits Using Fault Sampling. VLSI Design (1998)
Srikanth Venkataraman, W. Kent Fuchs
A deductive technique for diagnosis of bridging faults. ICCAD (1997)
Srikanth Venkataraman, W. Kent Fuchs
Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. ITC (1997)
Srikanth Venkataraman, W. Kent Fuchs
Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. VLSI Design (1997)
Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman
Diagnostic simulation of stuck-at faults in combinational circuits. J. Electron. Test. 8 (1) (1996)
Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs
Dynamic diagnosis of sequential circuits based on stuck-at faults. VTS (1996)
Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
Partial Scan Design Based on Circuit State Information. DAC (1996)
Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel
Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. DAC (1995)
Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44 (2) (1995)