Login / Signup
Will Howell
ORCID
Publication Activity (10 Years)
Years Active: 2018-2021
Publications (10 Years): 2
Top Topics
Methods Can Be Applied
Preprocessing
Search Methods
High Volume
Top Venues
ITC
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
</>
Publications
</>
Friedrich Hapke
,
Will Howell
,
Peter C. Maxwell
,
Edward Brazil
,
Srikanth Venkataraman
,
Rudrajit Dutta
,
Andreas Glowatz
,
Anja Fast
,
Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
40 (3) (2021)
Will Howell
,
Friedrich Hapke
,
Edward Brazil
,
Srikanth Venkataraman
,
R. Datta
,
Andreas Glowatz
,
Wilfried Redemund
,
J. Schmerberg
,
Anja Fast
,
Janusz Rajski
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.
ITC
(2018)