Andreas Glowatz

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 5

Top Topics

Mutation Testing

Microscope Images

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz
Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. ITC (2023)
Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna
Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test 39 (5) (2022)
Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz
On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. ATS (2021)
Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC (2018)
Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (9) (2014)
Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski
Cell-aware experiences in a high-quality automotive test suite. ETS (2014)
Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
Fault collapsing of multi-conditional faults. DDECS (2013)
Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski
Cell-aware Production test results from a 32-nm notebook processor. ITC (2012)
Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
A new SAT-based ATPG for generating highly compacted test sets. DDECS (2012)
Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD (2012)
Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers
Cell-aware analysis for small-delay effects and production test results from different fault models. ITC (2011)
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
Defect-oriented cell-internal testing. ITC (2010)
Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. 26 (3) (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW (2009)
Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz
Restrict Encoding for Mixed-Mode BIST. VTS (2009)
Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille
On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (7) (2008)
Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL (2007)
Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE (2007)
Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC (2007)
Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef
Programmable deterministic Built-In Self-Test. ITC (2007)
Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel
Computation and Application of Absolute Dominators in Industrial Designs. ETS (2007)
Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke
Fault detection and diagnosis with parity trees for space compaction of test responses. DAC (2006)
Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI (2005)