A new SAT-based ATPG for generating highly compacted test sets.

Stephan Eggersglüß Rene Krenz-Baath Andreas Glowatz Friedrich Hapke Rolf Drechsler

Published in: DDECS (2012)

Keyphrases

test set
error rate
training set
test data
answer set programming
training data
evaluation methodology
ai planning
bounded model checking
sat solvers
test cases
random selection
answer sets
planning domains
image processing
learning algorithm
machine learning