Rene Krenz-Baath

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 8

Top Topics

Industrial Applications

Evaluation Methodology

Top Venues

Publications

Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser
Verifying Bio-Electronic Systems. DDECS (2023)
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke
BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE (2017)
Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath
A suite of IEEE 1687 benchmark networks. ITC (2016)
Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser
Computing optimal communication schedules for time-triggered networks using an SMT solver. SIES (2016)
Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson
Upper-bound computation for optimal retargeting in IEEE1687 networks. ITC (2016)
Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (12) (2016)
Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson
Access time minimization in IEEE 1687 networks. ITC (2015)
Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser
Optimal SAT-based scheduler for time-triggered networks-on-a-chip. SIES (2015)
Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath
Design, Verification, and Application of IEEE 1687. ATS (2014)
Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
Optimization-based multiple target test generation for highly compacted test sets. ETS (2014)
Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
Industrial Application of IEEE P1687 for an Automotive Product. DSD (2013)
Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
Fault collapsing of multi-conditional faults. DDECS (2013)
Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
A new SAT-based ATPG for generating highly compacted test sets. DDECS (2012)
Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD (2012)
Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. ETS (2010)
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
Defect-oriented cell-internal testing. ITC (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel
Computation and Application of Absolute Dominators in Industrial Designs. ETS (2007)