Hamidreza Hashempour

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 6

Top Topics

Synthetic Aperture Radar

Top Venues

IEEE Trans. Computational Imaging

IEEE Trans. Geosci. Remote. Sens.

Publications

Hamidreza Hashempour, Majid Moradikia, Hamed Bastami, Ahmed Abdelhadi, Mojtaba Soltanalian
Fast and Robust LRSD-Based SAR/ISAR Imaging and Decomposition. IEEE Trans. Geosci. Remote. Sens. 60 (2022)
Hamidreza Hashempour, Hamed Bastami, Majid Moradikia, Seyed A. Zekavat, Hamid Behroozi, A. Lee Swindlehurst
Secure SWIPT in STAR-RIS Aided Downlink MISO Rate-Splitting Multiple Access Networks. CoRR (2022)
Amir Ghalamzan E, Kiyanoush Nazari, Hamidreza Hashempour, Fangxun Zhong
Deep-LfD: Deep robot learning from demonstrations. Softw. Impacts 9 (2021)
Majid Moradikia, Sadegh Samadi, Hamidreza Hashempour, Müjdat Çetin
Video-SAR Imaging of Dynamic Scenes Using Low-Rank and Sparse Decomposition. IEEE Trans. Computational Imaging 7 (2021)
Hamidreza Hashempour, Kiyanoush Nazari, Fangxun Zhong, Amir Ghalamzan E
A data-set of piercing needle through deformable objects for Deep Learning from Demonstrations. CoRR (2020)
Hamidreza Hashempour, Mohammad Ali Masnadi-Shirazi
Inverse synthetic aperture radar phase adjustment and cross-range scaling based on sparsity. Digit. Signal Process. 68 (2017)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29 (5) (2012)
Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT (2011)
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE (2011)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for analog/mixed-signal devices. ITC (2011)
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
Defect-oriented cell-internal testing. ITC (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electron. Test. 25 (1) (2009)
Hamidreza Hashempour, Fabrizio Lombardi
Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets. IEEE Trans. Instrum. Meas. 57 (9) (2008)
Hamidreza Hashempour, Fabrizio Lombardi
Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Des. Test Comput. 25 (2) (2008)
Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, Rakesh Mehta, Tim Alton
An Integrated Environment for Design Verification of ATE Systems. IEEE Trans. Instrum. Meas. 56 (5) (2007)
Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Faizal Karim, Konrad Walus, André Ivanov
On the Error Effects of Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. DFT (2007)
Hamidreza Hashempour, Fabrizio Lombardi
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE (2007)
Hamidreza Hashempour, Fabrizio Lombardi
A Novel Methodology for Functional Test Data Compression. DFT (2006)
Hamidreza Hashempour, Fabrizio Lombardi
Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI (2005)
Hamidreza Hashempour, Fabrizio Lombardi
Improving Error Resilience for Compressed Test Sets by Don't Care Assignment. SoCC (2005)
Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI (2005)
Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE (2005)
Hamidreza Hashempour, Fabrizio Lombardi
Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54 (9) (2005)
Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data. IEEE Trans. Instrum. Meas. 54 (5) (2005)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. 54 (5) (2005)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans. Instrum. Meas. 53 (2) (2004)
Hamidreza Hashempour, Fabrizio Lombardi
Compression of VLSI Test Data by Arithmetic Coding. DFT (2004)
Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi
Error-Resilient Test Data Compression Using Tunstall Codes. DFT (2004)
Hamidreza Hashempour, Fabrizio Lombardi
Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI (2004)
Hamidreza Hashempour, Fabrizio Lombardi
ATE-Amenable Test Data Compression with No Cyclic Scan. DFT (2003)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
Hybrid Multisite Testing at Manufacturing. ITC (2003)
Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park
A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT (2002)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT (2002)