Fred J. Meyer

Publication Activity (10 Years)

Years Active: 1988-2006
Publications (10 Years): 0

Publications

Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer
Measuring the timing jitter of ATE in the frequency domain. IEEE Trans. Instrum. Meas. 55 (1) (2006)
Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi
Evaluating the Yield of Repairable SRAMs for ATE. IEEE Trans. Instrum. Meas. 55 (5) (2006)
Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer
QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT (2005)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. 54 (5) (2005)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans. Instrum. Meas. 53 (2) (2004)
Cristiana Bolchini, Fred J. Meyer
Guest editorial. J. Syst. Archit. 50 (5) (2004)
Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi
Sequential diagnosis of processor array systems. IEEE Trans. Reliab. 53 (4) (2004)
Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi
Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI (2004)
Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi
On The Yield of Compiler-Based eSRAMs. DFT (2004)
Tao Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer
Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT (2004)
Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers 52 (10) (2003)
Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. 52 (6) (2003)
Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT (2003)
Fred J. Meyer, Nohpill Park
Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers 52 (11) (2003)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park
Maximal diagnosis of interconnects of random access memories. IEEE Trans. Reliab. 52 (4) (2003)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
Hybrid Multisite Testing at Manufacturing. ITC (2003)
Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
Quality-effective repair of multichip module systems. J. Syst. Archit. 47 (10) (2002)
Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
Random Testing of Multi-Port Static Random Access Memories. MTDT (2002)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Des. Test Comput. 19 (1) (2002)
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT (2002)
Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
Connectivity-Based Multichip Module Repair. PRDC (2001)
Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT (2001)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT (2000)
Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops (2000)
Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
Testing and testable designs for one-time programmable FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (11) (2000)
Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers 49 (1) (2000)
Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
Quality-Effective Repair of Multichip Module Systems. DFT (2000)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Maximal Diagnosis of Interconnects of Random Access Memories. VTS (1999)
Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium (1999)
Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
Design Verification of FPGA Implementations. IEEE Des. Test Comput. 16 (2) (1999)
Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT (1999)
Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer
Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Des. Test Comput. 16 (1) (1999)
Xiao-Tao Chen, Wenyi Feng, Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Reconfiguring one-time programmable FPGAs. IEEE Micro 19 (6) (1999)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electron. Test. 15 (1-2) (1999)
Fred J. Meyer, Fabrizio Lombardi, Jun Zhao
Good Processor Identification in Two-Dimensional Grids. DFT (1999)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT (1999)
Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS (1999)
Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. Very Large Scale Integr. Syst. 7 (1) (1999)
Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT (1999)
Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi
A New Method for Testing EEPLA's. DFT (1998)
Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi
On the Complexity of Sequential Testing in Configurable FPGAs. DFT (1998)
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS (1998)
Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. 3 (2) (1998)
Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
Fault Detection in a Tristate System Environment. Asian Test Symposium (1998)
Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi
Testing configurable LUT-based FPGA's. IEEE Trans. Very Large Scale Integr. Syst. 6 (2) (1998)
David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi
Testing of programmable logic devices (PLD) with faulty resources. DFT (1997)
Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
On the Fault Coverage of Interconnect Diagnosis. VTS (1997)
Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi
Multiple fault detection in logic resources of FPGAs. DFT (1997)
Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi
Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS (1997)
Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi
A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium (1997)
D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan
Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. IEEE Trans. Very Large Scale Integr. Syst. 1 (4) (1993)
Dhiraj K. Pradhan, Fred J. Meyer
Communication structures in fault-tolerant distributed systems. Networks 23 (4) (1993)
Fred J. Meyer, Dhiraj K. Pradhan
Consensus With Dual Failure Modes. IEEE Trans. Parallel Distributed Syst. 2 (2) (1991)
Fred J. Meyer, Dhiraj K. Pradhan
Modeling Defect Spatial Distribution. IEEE Trans. Computers 38 (4) (1989)
Fred J. Meyer, Dhiraj K. Pradhan
Dynamic Testing Strategy for Distributed Systems. IEEE Trans. Computers 38 (3) (1989)
Fred J. Meyer, Dhiraj K. Pradhan
Flip-Trees: Fault-Tolerant Graphs with Wide Containers. IEEE Trans. Computers 37 (4) (1988)