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Evaluating the Yield of Repairable SRAMs for ATE.

Marco OttaviLuca SchianoXiaopeng WangYong-Bin KimFred J. MeyerFabrizio Lombardi
Published in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
  • machine learning
  • management system
  • neural network
  • domain knowledge
  • reliability analysis