Testing of programmable logic devices (PLD) with faulty resources.
David AshenFred J. MeyerNohpill ParkFabrizio LombardiPublished in: DFT (1997)
Keyphrases
- programmable logic
- limited resources
- fault model
- field programmable gate array
- hardware platforms
- mobile devices
- low cost
- mobile applications
- test cases
- ubiquitous computing environments
- neural network
- resource constraints
- computing resources
- resource management
- multiple faults
- model based diagnosis
- embedded systems
- data processing
- end users
- pattern recognition
- artificial intelligence