MULTIPLE FAULTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Jong-Myon Kim
- Xuefeng Chen
- Sun-Yuan Hsieh
- Krishnendu Chakrabarty
- Ruqiang Yan
- Zhongkui Zhu
- Janusz Rajski
- Kewal K. Saluja
- Weihua Li
- Hiroshi Takahashi
- Fengshou Gu
- Bin Jiang
- Srikanth Venkataraman
- Khashayar Khorasani
- Changqing Shen
- Haidong Shao
- Andrew D. Ball
- Vishwani D. Agrawal
- Wu-Tung Cheng
- Chuan Li
- Matteo Sonza Reorda
- Silvio Simani
- Yuzo Takamatsu
- Krishna R. Pattipati
- Xinli Gu
- Xingxing Jiang
- Zhaobo Zhang
- Shi-Yu Huang
- Andrzej Pelc
- Pabitra Mohan Khilar
- Abhijit Chatterjee
- Zhibin Zhao
- Mourad Elhadef
- Marios M. Polycarpou
- Kwang-Ting Cheng
- Weiguo Huang
- Cheng-Wen Wu
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- Sensors
- IEEE Trans. Ind. Electron.
- ITC
- Expert Syst. Appl.
- IEEE Trans. Computers
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- Entropy
- Neurocomputing
- ACC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- WSC
- VTS
- Reliab. Eng. Syst. Saf.
- Knowl. Based Syst.
- CDC
- IECON
- J. Electron. Test.
- Asian Test Symposium
- Adv. Eng. Informatics
- J. Intell. Fuzzy Syst.
- Autom.
- DATE
- ECC
- I2MTC
- Appl. Soft Comput.
- SMC
- VLSI Design
- DAC
- DFT
- IACR Cryptol. ePrint Arch.
- CAA SAFEPROCESS
- Inf. Sci.
- ETS
- J. Intell. Manuf.
- Neural Comput. Appl.
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