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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Jong-Myon Kim
- Xuefeng Chen
- Ruqiang Yan
- Krishnendu Chakrabarty
- Sun-Yuan Hsieh
- Janusz Rajski
- Zhongkui Zhu
- Weihua Li
- Kewal K. Saluja
- Bin Jiang
- Fengshou Gu
- Hiroshi Takahashi
- Srikanth Venkataraman
- Changqing Shen
- Khashayar Khorasani
- Haidong Shao
- Vishwani D. Agrawal
- Andrew D. Ball
- Wu-Tung Cheng
- Silvio Simani
- Krishna R. Pattipati
- Chuan Li
- Yuzo Takamatsu
- Matteo Sonza Reorda
- Xinli Gu
- Pabitra Mohan Khilar
- Shi-Yu Huang
- Zhaobo Zhang
- Xingxing Jiang
- Andrzej Pelc
- Abhijit Chatterjee
- Zhibin Zhao
- Yoshinobu Higami
- Cheng-Wen Wu
- Fabrizio Lombardi
- Weiguo Huang
- Mourad Elhadef
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- Sensors
- IEEE Trans. Ind. Electron.
- ITC
- Expert Syst. Appl.
- IEEE Trans. Computers
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- Entropy
- ACC
- Neurocomputing
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- WSC
- VTS
- Reliab. Eng. Syst. Saf.
- Knowl. Based Syst.
- CDC
- J. Electron. Test.
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- Asian Test Symposium
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- J. Intell. Fuzzy Syst.
- ECC
- Autom.
- DATE
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- SMC
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- DAC
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- IACR Cryptol. ePrint Arch.
- CAA SAFEPROCESS
- Inf. Sci.
- ETS
- Neural Comput. Appl.
- J. Intell. Manuf.
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