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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Jong-Myon Kim
- Krishnendu Chakrabarty
- Sun-Yuan Hsieh
- Ruqiang Yan
- Xuefeng Chen
- Janusz Rajski
- Zhongkui Zhu
- Weihua Li
- Kewal K. Saluja
- Fengshou Gu
- Hiroshi Takahashi
- Bin Jiang
- Srikanth Venkataraman
- Khashayar Khorasani
- Changqing Shen
- Haidong Shao
- Wu-Tung Cheng
- Vishwani D. Agrawal
- Andrew D. Ball
- Matteo Sonza Reorda
- Yuzo Takamatsu
- Silvio Simani
- Krishna R. Pattipati
- Chuan Li
- Andrzej Pelc
- Xinli Gu
- Pabitra Mohan Khilar
- Shi-Yu Huang
- Zhaobo Zhang
- Xingxing Jiang
- Abhijit Chatterjee
- Zhibin Zhao
- Marios M. Polycarpou
- Kwang-Ting Cheng
- Lih-Hsing Hsu
- Yoshinobu Higami
- Cheng-Wen Wu
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- Sensors
- IEEE Trans. Ind. Electron.
- ITC
- Expert Syst. Appl.
- IEEE Trans. Computers
- IEEE Trans. Ind. Informatics
- Eng. Appl. Artif. Intell.
- Entropy
- ACC
- Neurocomputing
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- WSC
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- Reliab. Eng. Syst. Saf.
- Knowl. Based Syst.
- CDC
- J. Electron. Test.
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- J. Intell. Fuzzy Syst.
- ECC
- DATE
- Autom.
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- VLSI Design
- DAC
- DFT
- IACR Cryptol. ePrint Arch.
- CAA SAFEPROCESS
- Inf. Sci.
- ETS
- Neural Comput. Appl.
- IEEE Trans. Autom. Control.
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