Xinli Gu

Publication Activity (10 Years)

Years Active: 1991-2022
Publications (10 Years): 25

Top Topics

Bayesian Network Models

Fault Diagnosis

Knowledge Transfer

Rotating Machinery

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (3) (2022)
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Board-Level Functional Fault Identification Using Streaming Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (9) (2021)
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (2) (2021)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (3) (2020)
Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Fine-grained Adaptive Testing Based on Quality Prediction. ACM Trans. Design Autom. Electr. Syst. 25 (5) (2020)
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Unsupervised Root-Cause Analysis for Integrated Systems. ITC (2020)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Self-Learning and Efficient Health-Status Analysis for a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (9) (2020)
Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation. ITC (2019)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Anomaly Detection and Health-Status Analysis in a Core Router System. IEEE Des. Test 36 (5) (2019)
Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Board-Level Functional Fault Identification using Streaming Data. VTS (2019)
Ghada Sokar, Yassien Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos
IP Session on Machine Learning Applications in IC Test-Related Tasks. VTS (2019)
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. VTS (2019)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (7) (2019)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (10) (2018)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Failure prediction based on anomaly detection for complex core routers. ICCAD (2018)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Self-Learning Health-Status Analysis for a Core Router System. ITC (2018)
Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu
Fine-Grained Adaptive Testing Based on Quality Prediction. ITC (2018)
Ting Wang, Yannan Liu, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu
RetroDMR: Troubleshooting non-deterministic faults with retrospective DMR. DATE (2017)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Changepoint-based anomaly detection in a core router system. ITC (2017)
Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu
Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. ETS (2017)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Symbol-based health-status analysis in a core router system. ITC (2017)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (2) (2016)
Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Accurate anomaly detection using correlation-based time-series analysis in a core router system. ITC (2016)
Shi Jin, Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (6) (2016)
Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu
Self-learning and adaptive board-level functional fault diagnosis. ASP-DAC (2015)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (6) (2015)
Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu
On test syndrome merging for reasoning-based board-level functional fault diagnosis. ASP-DAC (2015)
Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu
Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis. IEEE Des. Test 31 (3) (2014)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (2) (2014)
Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda
Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? VTS (2014)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. ITC (2014)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (5) (2013)
Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. Asian Test Symposium (2013)
Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures. ITC (2013)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. ETS (2013)
Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS (2013)
Yu Hu, Xinli Gu, Xiaowei Li
In-Field Testing of NAND Flash Storage: Why and How? Asian Test Symposium (2012)
Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty
Diagnostic system based on support-vector machines for board-level functional diagnosis. ETS (2012)
Xinli Gu
Session Summary V: Is Component Interconnection Test Enough for Board or System Test. Asian Test Symposium (2012)
Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu
Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (10) (2012)
Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu
Reproduction and Detection of Board-Level Functional Failure. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (4) (2012)
Xinli Gu
Session Summary II: Dependable VLSI for Product Reliability. Asian Test Symposium (2012)
Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson
Re-using chip level DFT at board level. ETS (2012)
Xinli Gu
Are industrial test problems real problems? I thought research has resolved them all! ITC (2012)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. Asian Test Symposium (2012)
Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu
Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. Asian Test Symposium (2012)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Physical-Defect Modeling and Optimization for Fault-Insertion Test. IEEE Trans. Very Large Scale Integr. Syst. 20 (4) (2012)
Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. ITC (2011)
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
Deterministic test for the reproduction and detection of board-level functional failures. ASP-DAC (2011)
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. ETS (2011)
Xinli Gu
The gap: Test challenges in Asia manufacturing field. ITC (2011)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Board-level fault diagnosis using Bayesian inference. VTS (2010)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. Asian Test Symposium (2010)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Board-level fault diagnosis using an error-flow dictionary. ITC (2010)
Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. Asian Test Symposium (2010)
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
Physical defect modeling for fault insertion in system reliability test. ITC (2009)
Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu
VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Des. Test Comput. 25 (2) (2008)
Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu
Design for Board and System Level Structural Test and Diagnosis. ITC (2006)
Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow
A practical perspective on reducing ASIC NTFs. ITC (2005)
Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung
At-Speed Interconnect Test and Diagnosis of External Memories on a System. ITC (2004)
Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC (2004)
Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung
Re-Using DFT Logic for Functional and Silicon Debugging Test. ITC (2002)
Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian
An effort-minimized logic BIST implementation method. ITC (2001)
Mokhtar Hirech, James Beausang, Xinli Gu
A new approach to scan chain reordering using physical design information. ITC (1998)
Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng
A controller testability analysis and enhancement technique. ED&TC (1997)
Xinli Gu
RT level testability-driven partitioning. VTS (1995)
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
An Efficient and Economic Partitioning Approach for Testability. ITC (1995)
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
Testability analysis and improvement from VHDL behavioral specifications. EURO-DAC (1994)
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
An approach to testability analysis and improvement for VLSI systems. Microprocess. Microprogramming 35 (1-5) (1992)
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
Testability measure with reconvergent fanout analysis and its applications. Microprocessing and Microprogramming 32 (1-5) (1991)