Bill Eklow

Publication Activity (10 Years)

Years Active: 2002-2016
Publications (10 Years): 2

Top Topics

Reconfigurable Architecture

Highly Distributed

Recent Advances

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Des. Test Comput.

Publications

Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow
A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (2) (2016)
Bill Eklow
Recap of the ITC15 Test Conference. IEEE Des. Test 33 (1) (2016)
Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz
No Fault Found: The root cause. VTS (2015)
Mehdi Sadi, Zoe Conroy, Bill Eklow, Matthias Kamm, Nematollah Bidokhti, Mark Mohammad Tehranipoor
An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs. ATS (2014)
Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow
A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. ITC (2014)
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (9) (2014)
Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow
On effective and efficient in-field TSV repair for stacked 3D ICs. DAC (2013)
Li Jiang, Qiang Xu, Bill Eklow
On Effective Through-Silicon Via Repair for 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (4) (2013)
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs. Asian Test Symposium (2013)
Bill Eklow
Managing Complex Boundary-Scan Operations. IEEE Des. Test Comput. 29 (2) (2012)
Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow
Yield enhancement for 3D-stacked ICs: Recent advances and challenges. ASP-DAC (2012)
Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson
Re-using chip level DFT at board level. ETS (2012)
Li Jiang, Qiang Xu, Bill Eklow
On effective TSV repair for 3D-stacked ICs. DATE (2012)
Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow
FALCON: Rapid statistical fault coverage estimation for complex designs. ITC (2012)
Bill Eklow
Major Milestones for Two IEEE Standards Groups in 2011. IEEE Des. Test Comput. 28 (6) (2011)
John Malian, Bill Eklow
Embedded Testing in an In-Circuit Test Environment. ITC (2008)
Brice Achkir, Pavel Zivny, Bill Eklow
Parametric Testing of Optical Interfaces. ITC (2008)
Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC (2006)
Sylvain Tourangeau, Bill Eklow
Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. ITC (2006)
Bill Eklow, Ben Bennetts
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). ETS (2006)
Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts
IJTAG (internal JTAG): a step toward a DFT standard. ITC (2005)
Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow
Optimized reasoning-based diagnosis for non-random, board-level, production defects. ITC (2005)
Bill Eklow
An update on IEEE 1149.6 - successes and issues. ITC (2005)
Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow
A practical perspective on reducing ASIC NTFs. ITC (2005)
Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein
"Real Life" System Testing of Networking Equipment. ITC (2004)
Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC (2004)
Bill Eklow
IP Testing - The Future Differentiator? DATE (2004)
Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau
Simulation Based System Level Fault Insertion Using Co-verification Tools. ITC (2004)
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE (2004)
Bill Eklow
What Do You Mean My Board Test Stinks? ITC (2004)
Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz
IEEE 1149.6 - A Practical Perspective. ITC (2003)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. 20 (5) (2003)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC (2002)
Bill Eklow
Is Board Test Worth Talking About? ITC (2002)