Adam Cron

Publication Activity (10 Years)

Years Active: 1996-2023
Publications (10 Years): 9

Top Topics

Functional Verification

Messaging Service

Top Venues

Publications

Mridha Md Mashahedur Rahman, M. Sazadur Rahman, Rasheed Kibria, Mike Borza, Bandy Reddy, Adam Cron, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi
CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme. VTS (2023)
Adam Cron, Hailong Jiao, Erik Jan Marinissen
Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages. IEEE Des. Test 39 (5) (2022)
Teresa McLaurin, Adam Cron
Applying IEEE Test Standards to Multidie Designs. IEEE Des. Test 39 (5) (2022)
Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed Abdel-Moneum, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor
Quantifiable Assurance: From IPs to Platforms. CoRR (2022)
Md Sami Ul Islam Sami, Fahim Rahman, Farimah Farahmandi, Adam Cron, Mike Borza, Mark M. Tehranipoor
Invited: End-to-End Secure SoC Lifecycle Management. DAC (2021)
Adam Cron, Erik Jan Marinissen, Riccardo Mariani
IEEE Standard 1838 Is on the Move. Computer 54 (11) (2021)
Md Sami Ul Islam Sami, Fahim Rahman, Adam Cron, Dale R. Donchin, Mike Borza, Farimah Farahmandi, Mark M. Tehranipoor
POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly. HOST (2021)
Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed A. Abdelmoneum, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor
Quantifiable Assurance: From IPs to Platforms. IACR Cryptol. ePrint Arch. 2021 (2021)
Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. ETS (2018)
Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC (2006)
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE (2004)
Adam Cron
IEEE P1149.4-Almost a Standard. ITC (1997)
Adam Cron
A D&T Special Report: P1149.4 Mixed-Signal Test Bus. IEEE Des. Test Comput. 13 (3) (1996)