Carl Barnhart

Publication Activity (10 Years)

Years Active: 2000-2004
Publications (10 Years): 0

Publications

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE (2004)
Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz
IEEE 1149.6 - A Practical Perspective. ITC (2003)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. 20 (5) (2003)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC (2002)
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera
Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Des. Test Comput. 19 (5) (2002)
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko
OPMISR: the foundation for compressed ATPG vectors. ITC (2001)
Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater
A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium (2001)
Vivek Chickermane, Scott Richter, Carl Barnhart
Integrating Logic BIST in VLSI Designs with Embedded Memories. VTS (2000)