Donald L. Wheater

Publication Activity (10 Years)

Years Active: 1981-2003
Publications (10 Years): 0

Publications

Donald L. Wheater
ATE-Customer Perspectives & Requirements Panel. ITC (2003)
Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater
An On-Chip Self-Repair Calculation and Fusing Methodology. IEEE Des. Test Comput. 20 (5) (2003)
Lee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater
A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? VTS (2002)
Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater
On-Chip Repair and an ATE Independent Fusing Methodology. ITC (2002)
Robert C. Aitken, Donald L. Wheater
Guest Editors' Introduction: Stressing the Fundamentals. IEEE Des. Test Comput. 19 (5) (2002)
Tony Ambler, Donald L. Wheater
Test Trade-Offs Take Center Stage at ITC. IEEE Des. Test Comput. 18 (5) (2001)
Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater
A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium (2001)
Melvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater
Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS (1997)
Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix
ASIC Test Cost/Strategy Trade-offs. ITC (1994)
Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater
Low-Cost Testing of High-Density Logic Components. IEEE Des. Test Comput. 7 (2) (1990)
Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater
Low Cost Testing of High Density Logic Components. ITC (1989)
Donald L. Wheater
IBM's Cost Performance Array Tester Architecture for the 80's. ITC (1984)
Donald L. Wheater, Richard Soderman
The Series/1 as a Test System Controller for System Verification and Calibration. ITC (1981)