Bernd Könemann

Publication Activity (10 Years)

Years Active: 1992-2003
Publications (10 Years): 0

Publications

Bernd Könemann
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities. ICCD (2003)
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera
Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Des. Test Comput. 19 (5) (2002)
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko
OPMISR: the foundation for compressed ATPG vectors. ITC (2001)
Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater
A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium (2001)
Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
Built-In Self-Test: Assuring System Integrity. Computer 29 (11) (1996)
Kenneth D. Wagner, Bernd Könemann
Testable Programmable Digital Clock Pulse Control Elements. ITC (1993)
Bernd Könemann, Phil Noto
A Test Generation Methodology for High-Performance Computer Chips and Modules. ITC (1992)
Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams
Delay Test: The Next Frontier for LSSD Test Systems. ITC (1992)
Yaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen
AC Test Quality: Beyond Transition Fault Coverage. ITC (1992)