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Extending OPMISR beyond 10x Scan Test Efficiency.

Carl BarnhartVanessa BrunkhorstFrank DistlerOwen FarnsworthAndrew FerkoBrion L. KellerDavid ScottBernd KönemannTakeshi Onodera
Published in: IEEE Des. Test Comput. (2002)
Keyphrases
  • image segmentation
  • single scan
  • real time
  • databases
  • clustering algorithm
  • three dimensional
  • database systems
  • computational complexity
  • high efficiency