Robert C. Aitken

Publication Activity (10 Years)

Years Active: 1988-2022
Publications (10 Years): 4

Top Topics

Error Resilience

Transmission Electron Microscopy

Top Venues

IEEE J. Emerg. Sel. Topics Circuits Syst.

Publications

Xiaosu Lyu, Ludmila Cherkasova, Robert C. Aitken, Gabriel Parmer, Timothy Wood
Towards efficient processing of latency-sensitive serverless DAGs at the edge. EdgeSys@EuroSys (2022)
Robert C. Aitken
56th Design Automation Conference Report. IEEE Des. Test 36 (6) (2019)
Robert C. Aitken, Vikas Chandra, Brian Cline, Shidhartha Das, David Pietromonaco, Lucian Shifren, Saurabh Sinha, Greg Yeric
Predicting future complementary metal-oxide-semiconductor technology - challenges and approaches. IET Comput. Digit. Tech. 10 (6) (2016)
Azeez Bhavnagarwala, Imran Iqbal, An Nguyen, David Ondricek, Vikas Chandra, Robert C. Aitken
6T bitcell in a 16nm FinFET CMOS process. VLSI Circuits (2016)
Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED (2015)
Robert C. Aitken, Tetsuya Iizuka
Session 12 - Tutorial - beyond CMOS: Large area electronics-concepts and prospects. CICC (2015)
Robert C. Aitken, David Pietromonaco, Brian Cline
DFM is dead - Long live DFM. ICCD (2014)
Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
BTI-Gater: An Aging-Resilient Clock Gating Methodology. IEEE J. Emerg. Sel. Topics Circuits Syst. 4 (2) (2014)
Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
SlackProbe: A Flexible and Efficient In Situ Timing Slack Monitoring Methodology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (8) (2014)
Mihir R. Choudhury, Vikas Chandra, Robert C. Aitken, Kartik Mohanram
Time-Borrowing Circuit Designs and Hardware Prototyping for Timing Error Resilience. IEEE Trans. Computers 63 (2) (2014)
Robert C. Aitken, Greg Yeric, Brian Cline, Saurabh Sinha, Lucian Shifren, Imran Iqbal, Vikas Chandra
Physical design and FinFETs. ISPD (2014)
James Boley, Benton H. Calhoun, Vikas Chandra, Robert C. Aitken
Modeling SRAM dynamic VMIN. ICICDT (2014)
Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta
SlackProbe: a low overhead in situ on-line timing slack monitoring methodology. DATE (2013)
Robert C. Aitken, Görschwin Fey, Zbigniew T. Kalbarczyk, Frank Reichenbach, Matteo Sonza Reorda
Reliability analysis reloaded: how will we survive? DATE (2013)
James Boley, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun
. DATE (2013)
Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester
An adaptive write word-line pulse width and voltage modulation architecture for bit-interleaved 8T SRAMs. ISLPED (2012)
Kenneth Wagner, Martin St. Laurent, Robert C. Aitken, Hugh Barrass, Randall Robinson
Panel: going green across communications and storage systems: control of power in non-mobile devices. ISLPED (2012)
Satyanand Nalam, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun
Dynamic write limited minimum operating voltage for nanoscale SRAMs. DATE (2011)
Vikas Chandra, Robert C. Aitken
On the impact of gate oxide degradation on SRAM dynamic and static write-ability. ASP-DAC (2011)
Vikas Chandra, Robert C. Aitken
Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. DATE (2011)
Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester
Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. ISLPED (2011)
Michael Wieckowski, Dennis Sylvester, David T. Blaauw, Vikas Chandra, Sachin Idgunji, Cezary Pietrzyk, Robert C. Aitken
A black box method for stability analysis of arbitrary SRAM cell structures. DATE (2010)
Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken
Analytical model for TDDB-based performance degradation in combinational logic. DATE (2010)
Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger
Who solves the variability problem? DAC (2010)
Satyanand Nalam, Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken, Benton H. Calhoun
Asymmetric 6T SRAM with two-phase write and split bitline differential sensing for low voltage operation. ISQED (2010)
S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu
Modeling the impact of process variation on resistive bridge defects. ITC (2010)
Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken
TIMBER: Time borrowing and error relaying for online timing error resilience. DATE (2010)
Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken
On the efficacy of write-assist techniques in low voltage nanoscale SRAMs. DATE (2010)
Robert C. Aitken
DFX and Productivity. VLSI Design (2009)
Robert C. Aitken
The challenges of correlating silicon and models in high variability CMOS processes. ISPD (2009)
Vikas Chandra, Robert C. Aitken
Impact of voltage scaling on nanoscale SRAM reliability. DATE (2009)
S. Turnoy, Peter Wintermayr, Robert C. Aitken, Rudy Lauwereins, J. Tracy Weed, V. Kiefer, J. Hartmann
Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. DATE (2008)
Vikas Chandra, Robert C. Aitken
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. DFT (2008)
Dimitris Gizopoulos, Robert C. Aitken, Sandip Kundu
Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". IEEE Trans. Very Large Scale Integr. Syst. 15 (5) (2007)
Robert C. Aitken, Sachin Idgunji
Worst-case design and margin for embedded SRAM. DATE (2007)
Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
Test Roles in Diagnosis and Silicon Debug. ATS (2007)
Robert C. Aitken
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. ISQED (2007)
Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki
DFM/DFY: should you trust the surgeon or the family doctor? DATE (2007)
Robert C. Aitken
Reliability Issues for Embedded SRAM at 90nm and Below. IOLTS (2006)
Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon
Low-power design tools: are EDA vendors taking this matter seriously? DATE (2006)
Robert C. Aitken
The Design and Validation of IP for DFM/DFY Assurance. ITC (2006)
Robert C. Aitken
DFM Metrics for Standard Cells. ISQED (2006)
Robert C. Aitken
ITC is Cool. IEEE Des. Test Comput. 22 (6) (2005)
Mike Zachariah, Robert C. Aitken
ESD implementation strategies. CICC (2005)
Gordon W. Roberts, Robert C. Aitken
Noise and reliability containment approaches. CICC (2005)
Robert C. Aitken, Betina Hold
Modeling Soft-Error Susceptibility for IP Blocks. IOLTS (2005)
Robert C. Aitken
Redundancy & It's Not Just for Defects Anymore. MTDT (2004)
Robert C. Aitken, Fidel Muradali
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE (2004)
Robert C. Aitken
A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. ITC (2004)
Robert C. Aitken
DFM: The Real 90nm Hurdle. ITC (2003)
Gordon W. Roberts, Robert C. Aitken
ITC Highlights. IEEE Des. Test Comput. 20 (5) (2003)
Robert C. Aitken
Applying Defect-Based Test to Embedded Memories in a COT Model. MTDT (2003)
Robert C. Aitken
Silicon IP And Successful DFM. ITC (2003)
Dimitris Gizopoulos, Robert C. Aitken
Guest editorial - testing and verification of communication system-on-chip devices. IEEE Commun. Mag. 41 (9) (2003)
Robert C. Aitken, Gordon W. Roberts
ITC 2003: Breaking Test Interface Bottlenecks. IEEE Des. Test Comput. 20 (5) (2003)
Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin
Wireless Test. VTS (2002)
Robert C. Aitken
Test Generation and Fault Modeling for Stress Testing (invited). ISQED (2002)
Robert C. Aitken, Donald L. Wheater
Guest Editors' Introduction: Stressing the Fundamentals. IEEE Des. Test Comput. 19 (5) (2002)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production IDDQ testing. ITC (2000)
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
Current ratios: a self-scaling technique for production I_DDQ testing. ITC (1999)
Robert C. Aitken
It Makes Sense to Combine DFT and DFR/DFY. ITC (1999)
Robert C. Aitken
Nanometer Technology Effects on Fault Models for IC Testing. Computer 32 (11) (1999)
Robert C. Aitken, Fidel Muradali
Trends in SLI design and their effect on test. ITC (1999)
Robert C. Aitken
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. VTS (1999)
Robert C. Aitken
On-chip versus off-chip test: an artificial dichotomy. ITC (1998)
Robert C. Aitken, Jason Cong, Randy Harr, Kenneth L. Shepard, Wayne H. Wolf
How will CAD handle billion-transistor systems? (panel). ICCAD (1998)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC (1997)
Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian
Power Dissipation During Testing: Should We Worry About it? VTS (1997)
Robert C. Aitken
Modeling the Unmodelable: Algorithmic Fault Diagnosis. IEEE Des. Test Comput. 14 (3) (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS (1997)
Robert C. Aitken
Modelling the Unmodellable: Algorithmic Fault Diagnosis. ITC (1996)
Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck
Volume Manufacturing - ICs and Boards: DFT to the Rescue? VTS (1996)
Robert C. Aitken
When tools cry wolf: Testability pitfalls of synthesized designs. IEEE Des. Test Comput. 13 (4) (1996)
Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown
and AC Scan: The War Against Unmodelled Defects. ITC (1996)
Robert C. Aitken
Finding Defects with Fault Models. ITC (1995)
Robert C. Aitken
An Overview of Test Synthesis Tools. IEEE Des. Test Comput. 12 (2) (1995)
Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman
The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC (1994)
Peter C. Maxwell, Robert C. Aitken
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC (1993)
Robert C. Aitken
Measurements. ITC (1993)
Peter C. Maxwell, Robert C. Aitken
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. 10 (1) (1993)
Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC (1992)
Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal
Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11 (1) (1992)
Robert C. Aitken
Measurements. ITC (1992)
Peter C. Maxwell, Robert C. Aitken
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. 3 (4) (1992)
Robert C. Aitken
Diagnosis of leakage faults with IDDQ. J. Electron. Test. 3 (4) (1992)
Robert C. Aitken
Fault Location with Current Monitoring. ITC (1991)
Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC (1991)
Robert C. Aitken, Vinod K. Agarwal
A diagnosis method using pseudo-random vectors without intermediate signatures. ICCAD (1989)
Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal
: Experiments on Aliasing in Signature Analysis Registers. ITC (1989)
Robert C. Aitken, Vinod K. Agarwal
Aliasing probability of non-exhaustive randomized syndrome tests. ICCAD (1988)