Applying Defect-Based Test to Embedded Memories in a COT Model.
Robert C. AitkenPublished in: MTDT (2003)
Keyphrases
- test data
- cost function
- statistical model
- computational model
- theoretical analysis
- management system
- neural network
- case study
- mathematical model
- probability distribution
- probabilistic model
- parameter values
- bayesian framework
- neural network model
- experimental data
- em algorithm
- database
- expert systems
- multi agent systems
- multi agent
- objective function
- similarity measure
- high level
- data sets
- real time