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, Functional and Scan Tests: How Many Fault Coverages Do We Need?

Peter C. MaxwellRobert C. AitkenVic JohansenInshen Chiang
Published in: ITC (1992)
Keyphrases
  • fault diagnosis
  • fault detection
  • scan data
  • diagnostic tests
  • neural network
  • statistical tests
  • data mining
  • information retrieval
  • multiscale
  • transmission line
  • functional analysis
  • fault model