DIAGNOSTIC TESTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- W. Kent Fuchs
- Srikanth Venkataraman
- Abhijit Chatterjee
- Wu-Tung Cheng
- Matteo Sonza Reorda
- Cheng-Wen Wu
- Hans-Joachim Wunderlich
- Krishnendu Chakrabarty
- Juan de Dios Luna del Castillo
- José Antonio Roldán Nofuentes
- Arne Wahrburg
- Elizabeth M. Rudnick
- Janak H. Patel
- Alexander Felfernig
- Dominique Sauter
- Christopher G. Chute
- Yu Huang
- Vishwani D. Agrawal
- Jürgen Adamy
- Kewal K. Saluja
- Huaxing Tang
- Yervant Zorian
- Sasikumar Cherubal
- Janusz Rajski
- Na Hong
- Alejandro Cook
- Nagesh Tamarapalli
- M. Enamul Amyeen
- Michael S. Hsiao
- Franz Wotawa
- Charles E. Stroud
- James Chien-Mo Li
- Hiroshi Takahashi
- John W. Sheppard
- Sreejit Chakravarty
- Yoshinobu Higami
- Sybille Hellebrand
Venues
- CoRR
- ITC
- VTS
- AMIA
- IEEE Access
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- ATS
- IEEE Trans. Instrum. Meas.
- DAC
- ECAI
- BMC Medical Informatics Decis. Mak.
- Asian Test Symposium
- EMBC
- Commun. Stat. Simul. Comput.
- J. Am. Medical Informatics Assoc.
- Comput. Biol. Medicine
- Artif. Intell. Medicine
- VLSI Design
- J. Electron. Test.
- DATE
- Microelectron. Reliab.
- IEEE Trans. Ind. Electron.
- ACC
- BMC Medical Imaging
- ETS
- IET Comput. Digit. Tech.
- BIBM
- J. Biomed. Informatics
- IEEE Des. Test Comput.
- AAAI
- MedInfo
- Medical Biol. Eng. Comput.
- Comput. Math. Methods Medicine
- Comput. Stat. Data Anal.
- CDC
- DFT
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