DIAGNOSTIC TESTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Abhijit Chatterjee
- Srikanth Venkataraman
- W. Kent Fuchs
- Wu-Tung Cheng
- Matteo Sonza Reorda
- Cheng-Wen Wu
- Hans-Joachim Wunderlich
- Krishnendu Chakrabarty
- Elizabeth M. Rudnick
- José Antonio Roldán Nofuentes
- Arne Wahrburg
- Janak H. Patel
- Juan de Dios Luna del Castillo
- Alexander Felfernig
- Vishwani D. Agrawal
- Yu Huang
- Christopher G. Chute
- Jürgen Adamy
- Dominique Sauter
- Kewal K. Saluja
- Huaxing Tang
- Michael S. Hsiao
- Janusz Rajski
- Yervant Zorian
- Hiroshi Takahashi
- Nagesh Tamarapalli
- Kuen-Jong Lee
- Sybille Hellebrand
- Guoqian Jiang
- Charles E. Stroud
- Miron Abramovici
- Yoshinobu Higami
- John W. Sheppard
- Sasikumar Cherubal
- Sreejit Chakravarty
- Na Hong
- Anna E. Yankovskaya
Venues
- CoRR
- ITC
- VTS
- IEEE Access
- AMIA
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- ATS
- IEEE Trans. Instrum. Meas.
- DAC
- Asian Test Symposium
- BMC Medical Informatics Decis. Mak.
- ECAI
- VLSI Design
- Artif. Intell. Medicine
- Comput. Biol. Medicine
- Commun. Stat. Simul. Comput.
- J. Am. Medical Informatics Assoc.
- EMBC
- J. Electron. Test.
- Microelectron. Reliab.
- DATE
- IEEE Trans. Ind. Electron.
- ACC
- BIBM
- BMC Medical Imaging
- ETS
- IET Comput. Digit. Tech.
- J. Biomed. Informatics
- Medical Biol. Eng. Comput.
- MedInfo
- AAAI
- IEEE Des. Test Comput.
- CDC
- Comput. Math. Methods Medicine
- Comput. Stat. Data Anal.
- npj Digit. Medicine
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