DIAGNOSTIC TESTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Srikanth Venkataraman
- W. Kent Fuchs
- Abhijit Chatterjee
- Wu-Tung Cheng
- Matteo Sonza Reorda
- Hans-Joachim Wunderlich
- Cheng-Wen Wu
- Alexander Felfernig
- Arne Wahrburg
- Krishnendu Chakrabarty
- Janak H. Patel
- José Antonio Roldán Nofuentes
- Juan de Dios Luna del Castillo
- Elizabeth M. Rudnick
- Jürgen Adamy
- Vishwani D. Agrawal
- Christopher G. Chute
- Dominique Sauter
- Huaxing Tang
- Yu Huang
- Kewal K. Saluja
- Yoshinobu Higami
- Miron Abramovici
- Alexander Feldman
- Yervant Zorian
- Michael S. Hsiao
- Kuen-Jong Lee
- Frédéric Besson
- Nagesh Tamarapalli
- John W. Sheppard
- James Chien-Mo Li
- Sasikumar Cherubal
- M. Enamul Amyeen
- Hiroshi Takahashi
- Na Hong
- Anna E. Yankovskaya
- Franz Wotawa
Venues
- CoRR
- ITC
- VTS
- AMIA
- IEEE Access
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- DAC
- IEEE Trans. Instrum. Meas.
- Asian Test Symposium
- ECAI
- BMC Medical Informatics Decis. Mak.
- VLSI Design
- EMBC
- Commun. Stat. Simul. Comput.
- J. Electron. Test.
- Artif. Intell. Medicine
- J. Am. Medical Informatics Assoc.
- DATE
- Microelectron. Reliab.
- Comput. Biol. Medicine
- BIBM
- ETS
- ACC
- IET Comput. Digit. Tech.
- BMC Medical Imaging
- Medical Biol. Eng. Comput.
- J. Biomed. Informatics
- MedInfo
- IEEE Trans. Ind. Electron.
- IEEE Des. Test Comput.
- npj Digit. Medicine
- DFT
- CDC
- Comput. Math. Methods Medicine
- ICCAD
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