DIAGNOSTIC TESTS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- W. Kent Fuchs
- Abhijit Chatterjee
- Srikanth Venkataraman
- Wu-Tung Cheng
- Matteo Sonza Reorda
- Hans-Joachim Wunderlich
- Cheng-Wen Wu
- Juan de Dios Luna del Castillo
- José Antonio Roldán Nofuentes
- Arne Wahrburg
- Janak H. Patel
- Alexander Felfernig
- Krishnendu Chakrabarty
- Elizabeth M. Rudnick
- Jürgen Adamy
- Christopher G. Chute
- Huaxing Tang
- Dominique Sauter
- Yu Huang
- Kewal K. Saluja
- Vishwani D. Agrawal
- Anna E. Yankovskaya
- John W. Sheppard
- Kuen-Jong Lee
- James Chien-Mo Li
- Na Hong
- Guoqian Jiang
- Nagesh Tamarapalli
- Frédéric Besson
- Hiroshi Takahashi
- Erik Frisk
- Yervant Zorian
- Janusz Rajski
- Alexander Feldman
- Yoshinobu Higami
- Sreejit Chakravarty
- Sybille Hellebrand
Venues
- CoRR
- ITC
- VTS
- AMIA
- IEEE Access
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Instrum. Meas.
- DAC
- BMC Medical Informatics Decis. Mak.
- Asian Test Symposium
- ECAI
- Commun. Stat. Simul. Comput.
- EMBC
- Artif. Intell. Medicine
- J. Am. Medical Informatics Assoc.
- Comput. Biol. Medicine
- VLSI Design
- J. Electron. Test.
- DATE
- Microelectron. Reliab.
- IEEE Trans. Ind. Electron.
- BMC Medical Imaging
- ETS
- IET Comput. Digit. Tech.
- BIBM
- ACC
- J. Biomed. Informatics
- AAAI
- Medical Biol. Eng. Comput.
- IEEE Des. Test Comput.
- MedInfo
- CDC
- Comput. Stat. Data Anal.
- npj Digit. Medicine
- ICCAD
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