Huaxing Tang

Publication Activity (10 Years)

Years Active: 2002-2020
Publications (10 Years): 7

Top Topics

Supervised Machine Learning

Histopathological Images

Top Venues

Publications

Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang
Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency. ITC (2020)
Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy
A supervised machine learning application in volume diagnosis. ETS (2019)
Tao Wang, Zhangchun Shi, Junlin Huang, Huaxing Tang, Wu Yang, Junna Zhong
A case study for using dynamic partitioning based solution in volume diagnosis. DATE (2018)
Huaxing Tang, Arvind Jain, Sanil Kumark Pillai, Dharmesh Joshi, Shamitha Rao
Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution for Cell Internal Defects. ATS (2017)
Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng
Scan Chain Diagnosis Based on Unsupervised Machine Learning. ATS (2017)
Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS (2016)
Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT (2015)
Jing Ye, Yu Hu, Xiaowei Li, Wu-Tung Cheng, Yu Huang, Huaxing Tang
Diagnose Failures Caused by Multiple Locations at a Time. IEEE Trans. Very Large Scale Integr. Syst. 22 (4) (2014)
Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS (2014)
Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
Distributed dynamic partitioning based diagnosis of scan chain. VTS (2013)
Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang
Employing the STDF V4-2007 Standard for Scan Test Data Logging. IEEE Des. Test 29 (6) (2012)
Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
Improved volume diagnosis throughput using dynamic design partitioning. ITC (2012)
Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. DFT (2011)
Andras Kun, Ralf Arnold, Peter Heinrich, Gwenolé Maugard, Huaxing Tang, Wu-Tung Cheng
Deterministic IDDQ diagnosis using a net activation based model. ITC (2011)
Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium (2011)
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC (2008)
Chen Liu, Wu-Tung Cheng, Huaxing Tang, Sudhakar M. Reddy, Wei Zou, Manish Sharma
Hyperactive Faults Dictionary to Increase Diagnosis Throughput. ATS (2008)
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS (2007)
Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. VTS (2007)
Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang
Interconnect open defect diagnosis with minimal physical information. ITC (2007)
Huaxing Tang, Chen Liu, Wu-Tung Cheng, Sudahkar M. Reddy, Wei Zou
Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead. ATS (2007)
Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC (2006)
Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang
On Methods to Improve Location Based Logic Diagnosis. VLSI Design (2006)
Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz
On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios. VLSI Design (2005)
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
Defect Aware Test Patterns. DATE (2005)
Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs. ITC (2003)
Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita
On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. ITC (2002)