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Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.

Huaxing TangBrady BenwareMichael ReeseJoseph CaroselliThomas HerrmannFriedrich HapkeRobert TaoWu-Tung ChengManish Sharma
Published in: ATS (2014)
Keyphrases
  • fault models
  • model based diagnosis
  • dynamic systems
  • fault model
  • fault management
  • horn clauses
  • databases
  • artificial intelligence
  • data analysis
  • model checking
  • network management