Brady Benware

Publication Activity (10 Years)

Years Active: 2003-2018
Publications (10 Years): 3

Top Topics

Automatic Identification

Heterogeneous Environments

Model Based Diagnosis

Top Venues

IEEE Des. Test Comput.

Publications

Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT (2018)
Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng
Scan Chain Diagnosis Based on Unsupervised Machine Learning. ATS (2017)
Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. ATS (2017)
Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT (2015)
Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala
Innovative practices session 2C: Advanced in yield learning. VTS (2014)
Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS (2014)
Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
Distributed dynamic partitioning based diagnosis of scan chain. VTS (2013)
Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. 29 (1) (2012)
Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
Improved volume diagnosis throughput using dynamic design partitioning. ITC (2012)
Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab
A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC (2011)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS (2011)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27 (5) (2011)
Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium (2011)
Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC (2010)
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
Diagnosis of failing scan cells through orthogonal response compaction. ETS (2010)
Manish Sharma, Chris Schuermyer, Brady Benware
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Des. Test Comput. 27 (3) (2010)
Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS (2009)
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC (2008)
Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake
Enhancing Transition Fault Model for Delay Defect Diagnosis. ATS (2008)
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS (2007)
Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
Silicon Evaluation of Static Alternative Fault Models. VTS (2007)
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23 (2) (2006)
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23 (5) (2006)
Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC (2006)
Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC (2005)
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch
The value of statistical testing for quality, yield and test cost improvement. ITC (2005)
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
Defect Screening Using Independent Component Analysis on I_DDQ. VTS (2005)
Joel Lurkins, DeAnna Hill, Brady Benware
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC (2005)
Brady Benware
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC (2004)
Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC (2004)
Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware
Detection of Temperature Sensitive Defects Using ZTC. VTS (2004)
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC (2004)
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS (2003)
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC (2003)
Robert Madge, Brady Benware, W. Robert Daasch
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20 (5) (2003)
Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
Impact of Multiple-Detect Test Patterns on Product Quality. ITC (2003)