Xiaoxin Fan

Publication Activity (10 Years)

Years Active: 2007-2022
Publications (10 Years): 2

Top Topics

Communication Overhead

Diagnostic Reasoning

Fault Localization

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
C-Testing and Efficient Fault Localization for AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
. ATS (2020)
Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
Distributed dynamic partitioning based diagnosis of scan chain. VTS (2013)
Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy
Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. Asian Test Symposium (2012)
Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
Improved volume diagnosis throughput using dynamic design partitioning. ITC (2012)
Xiaoxin Fan, Sudhakar M. Reddy, Irith Pomeranz
Max-Fill: A method to generate high quality delay tests. DDECS (2011)
Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato
Genetic algorithm based approach for segmented testing. DSN Workshops (2011)
Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium (2011)
Yu Hu, Xiang Fu, Xiaoxin Fan, Hideo Fujiwara
Localized random access scan: Towards low area and routing overhead. ASP-DAC (2008)
Xiaoxin Fan, Yu Hu, Laung-Terng Wang
An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing. ATS (2007)
Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li
The design-for-testability features of a general purpose microprocessor. ITC (2007)