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C-Testing and Efficient Fault Localization for AI Accelerators.

Arjun ChaudhuriChunsheng LiuXiaoxin FanKrishnendu Chakrabarty
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
  • fault localization
  • software testing
  • artificial intelligence
  • test cases
  • neural network
  • case study
  • intelligent systems
  • program understanding
  • decision making
  • search space
  • computational intelligence