FAULT LOCALIZATION
Experts
- Franz Wotawa
- Rui Abreu
- W. Eric Wong
- Mark Harman
- Yan Lei
- Árpád Beszédes
- Zhenyu Zhang
- Xiaoguang Mao
- David Lo
- Tsong Yueh Chen
- W. K. Chan
- Steven X. Ding
- Yong Liu
- Patrick Rodler
- T. H. Tse
- Arjan J. C. van Gemund
- Meir Kalech
- Vahid Garousi
- Gordon Fraser
- Kai-Yuan Cai
- Andy Podgurski
- Birgit Hofer
- Lu Zhang
- Dan Hao
- Baowen Xu
- Zheng Li
- Mary Jean Harrold
- Shujuan Jiang
- Xiang Chen
- Vidroha Debroy
- Saeed Parsa
- David W. Binkley
- Irith Pomeranz
- Krishnendu Chakrabarty
- Maiying Zhong
- Shin Yoo
- Josep Silva
- Ossi Taipale
- Rolf Drechsler
Venues
- CoRR
- IEEE Access
- ACC
- ICSE
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Computers
- ICST
- IEEE Trans. Ind. Electron.
- IECON
- J. Syst. Softw.
- IEEE Trans. Software Eng.
- ASE
- Inf. Softw. Technol.
- COMPSAC
- Softw. Test. Verification Reliab.
- CDC
- ICST Workshops
- ITC
- ICSM
- ACM SIGSOFT Softw. Eng. Notes
- QSIC
- ISSTA
- IEEE Trans. Ind. Informatics
- ISSRE
- SEKE
- Autom.
- J. Frankl. Inst.
- Eng. Appl. Artif. Intell.
- Int. J. Syst. Sci.
- SAC
- ECAI
- SMC
- ECC
- ESEC/SIGSOFT FSE
- QRS Companion
- SIGCSE
- J. Electron. Test.
- AAAI
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend