Arjun Chaudhuri

Publication Activity (10 Years)

Years Active: 2016-2024
Publications (10 Years): 45

Top Topics

Test Generation

Integrated Circuit

Design Automation

Fault Localization

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration. IEEE Trans. Very Large Scale Integr. Syst. 32 (7) (2024)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty
Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (11) (2023)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. ITC (2023)
Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty
. VTS (2023)
Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch
Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. VTS (2023)
Mingjie Liu, Teodor-Dumitru Ene, Robert Kirby, Chris Cheng, Nathaniel Ross Pinckney, Rongjian Liang, Jonah Alben, Himyanshu Anand, Sanmitra Banerjee, Ismet Bayraktaroglu, Bonita Bhaskaran, Bryan Catanzaro, Arjun Chaudhuri, Sharon Clay, Bill Dally, Laura Dang, Parikshit Deshpande, Siddhanth Dhodhi, Sameer Halepete, Eric Hill, Jiashang Hu, Sumit Jain, Brucek Khailany, Kishor Kunal, Xiaowei Li, Hao Liu, Stuart F. Oberman, Sujeet Omar, Sreedhar Pratty, Jonathan Raiman, Ambar Sarkar, Zhengjiang Shao, Hanfei Sun, Pratik P. Suthar, Varun Tej, Kaizhe Xu, Haoxing Ren
ChipNeMo: Domain-Adapted LLMs for Chip Design. CoRR (2023)
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty
Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 31 (3) (2023)
Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty
Analysis and Characterization of Defects in FeFETs. ITC (2023)
Jonti Talukdar, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Limt, Krishnendu Chakrabarty
Securing Heterogeneous 2.5D ICs Against IP Theft through Dynamic Interposer Obfuscation. DATE (2023)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
. VTS (2023)
Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty
. ETS (2023)
Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty
Functional Criticality Analysis of Structural Faults in AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (12) (2022)
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
C-Testing and Efficient Fault Localization for AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty
Automatic Structural Test Generation for Analog Circuits using Neural Twins. ITC (2022)
Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
Probabilistic Fault Grading for AI Accelerators using Neural Twins. ISVLSI (2022)
Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
Special Session: Fault Criticality Assessment in AI Accelerators. VTS (2022)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE (2022)
Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle. ICCAD (2022)
Lingjun Zhu, Arjun Chaudhuri, Sanmitra Banerjee, Gauthaman Murali, Pruek Vanna-Iampikul, Krishnendu Chakrabarty, Sung Kyu Lim
Design Automation and Test Solutions for Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18 (1) (2022)
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18 (1) (2022)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. ITC (2022)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE (2022)
Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Structural Test Generation for AI Accelerators using Neural Twins. IOLTS (2022)
Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty
. ETS (2022)
Arjun Chaudhuri, Jonti Talukdar, Jinwook Jung, Gi-Joon Nam, Krishnendu Chakrabarty
Fault-Criticality Assessment for AI Accelerators using Graph Convolutional Networks. DATE (2021)
Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Siddarth Madala, Abhishek Kumar Dubey, Krishnendu Chakrabarty
. ITC (2021)
Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Gauthaman Murali, Mark Nelson, Sung Kyu Lim, Krishnendu Chakrabarty
ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs. ICCAD (2021)
Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty
Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. DATE (2021)
Arjun Chaudhuri, Krishnendu Chakrabarty
. ITC-Asia (2021)
Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. Very Large Scale Integr. Syst. 29 (2) (2021)
Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Jinwoo Kim, Gauthaman Murali, Edward Lee, Daehyun Kim, Sung Kyu Lim, Saibal Mukhopadhyay, Krishnendu Chakrabarty
Advances in Design and Test of Monolithic 3-D ICs. IEEE Des. Test 37 (4) (2020)
Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
. ATS (2020)
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
. ATS (2020)
Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs. IEEE Trans. Very Large Scale Integr. Syst. 28 (6) (2020)
Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty
Functional Criticality Classification of Structural Faults in AI Accelerators. ITC (2020)
Jinwoo Kim, Gauthaman Murali, Pruek Vanna-Iampikul, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Saibal Mukhopadhyay, Sung Kyu Lim
RTL-to-GDS Design Tools for Monolithic 3D ICs. ICCAD (2020)
Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim
RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs. DAC (2019)
Arjun Chaudhuri, Bonan Yan, Yiran Chen, Krishnendu Chakrabarty
Hardware Fault Tolerance for Binary RRAM Crossbars. ITC (2019)
Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim
Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs. ETS (2019)
Arjun Chaudhuri, Mengyun Liu, Krishnendu Chakrabarty
Fault-Tolerant Neuromorphic Computing Systems. ITC (2019)
Arjun Chaudhuri, Sukeshwar Kannan, Luke England, Jack Golz
Compact Scalable Dynamic TSV IR Drop Compensation for Power Delivery in 3D Packages. MWSCAS (2019)
Arjun Chaudhuri, Krishnendu Chakrabarty
Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors. ITC (2018)
Anindya Shankar Bhandari, Arjun Chaudhuri, Swarnabha Roy, Shubham Negi, Mrigank Sharad
Single chip self-tunable N-input N-output PID control system with integrated analog front-end for miniature robotics. ICNSC (2017)
Arjun Chaudhuri
Selective De-noising of Sparse-Coloured Images. CoRR (2016)
Anindya Shankar Bhandari, Arjun Chaudhuri, Mrigank Sharad
Single Chip Self-Tunable N-Input N-Output PID Control System with Integrated Analog Front-end for Miniature Robotics. CoRR (2016)