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Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits.
Sanmitra Banerjee
Arjun Chaudhuri
August Ning
Krishnendu Chakrabarty
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2021)
Keyphrases
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fault model
fault diagnosis
fault models
chip design
power dissipation
high speed
fault detection
analog vlsi
carbon nanotubes
vlsi circuits
real time
neural network
circuit design
analog circuits
critical path
carbon dioxide