Sanmitra Banerjee

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 40

Top Topics

Test Generation

Fault Diagnosis

Design Automation

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration. IEEE Trans. Very Large Scale Integr. Syst. 32 (7) (2024)
Haotian Lu, Sanmitra Banerjee, Jiaqi Gu
DOCTOR: Dynamic On-Chip Remediation Against Temporally-Drifting Thermal Variations Toward Self-Corrected Photonic Tensor Accelerators. CoRR (2024)
Amin Shafiee, Sanmitra Banerjee, Benoît Charbonnier, Sudeep Pasricha, Mahdi Nikdast
Compact and Low-Loss PCM-based Silicon Photonic MZIs for Photonic Neural Networks. CoRR (2023)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty
Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (11) (2023)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. ITC (2023)
Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast
Analysis of Optical Loss and Crosstalk Noise in MZI-based Coherent Photonic Neural Networks. CoRR (2023)
Mingjie Liu, Teodor-Dumitru Ene, Robert Kirby, Chris Cheng, Nathaniel Ross Pinckney, Rongjian Liang, Jonah Alben, Himyanshu Anand, Sanmitra Banerjee, Ismet Bayraktaroglu, Bonita Bhaskaran, Bryan Catanzaro, Arjun Chaudhuri, Sharon Clay, Bill Dally, Laura Dang, Parikshit Deshpande, Siddhanth Dhodhi, Sameer Halepete, Eric Hill, Jiashang Hu, Sumit Jain, Brucek Khailany, Kishor Kunal, Xiaowei Li, Hao Liu, Stuart F. Oberman, Sujeet Omar, Sreedhar Pratty, Jonathan Raiman, Ambar Sarkar, Zhengjiang Shao, Hanfei Sun, Pratik P. Suthar, Varun Tej, Kaizhe Xu, Haoxing Ren
ChipNeMo: Domain-Adapted LLMs for Chip Design. CoRR (2023)
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty
Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 31 (3) (2023)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
On the Impact of Uncertainties in Silicon-Photonic Neural Networks. IEEE Des. Test 40 (2) (2023)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
. VTS (2023)
Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty
CHAMP: Coherent Hardware-Aware Magnitude Pruning of Integrated Photonic Neural Networks. OFC (2022)
Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast
LoCI: An Analysis of the Impact of Optical Loss and Crosstalk Noise in Integrated Silicon-Photonic Neural Networks. CoRR (2022)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
Characterizing Coherent Integrated Photonic Neural Networks under Imperfections. CoRR (2022)
Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast
LoCI: An Analysis of the Impact of Optical Loss and Crosstalk Noise in Integrated Silicon-Photonic Neural Networks. ACM Great Lakes Symposium on VLSI (2022)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE (2022)
Lingjun Zhu, Arjun Chaudhuri, Sanmitra Banerjee, Gauthaman Murali, Pruek Vanna-Iampikul, Krishnendu Chakrabarty, Sung Kyu Lim
Design Automation and Test Solutions for Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18 (1) (2022)
Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty
Pruning Coherent Integrated Photonic Neural Networks Using the Lottery Ticket Hypothesis. ISVLSI (2022)
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18 (1) (2022)
Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. ITC (2022)
Shao-Chun Hung, Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs. DATE (2022)
Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
Structural Test Generation for AI Accelerators using Neural Twins. IOLTS (2022)
Bonita Bhaskaran, Sanmitra Banerjee, Kaushik Narayanun, Shao-Chun Hung, Seyed Nima Mozaffari Mojaveri, Mengyun Liu, Gang Chen, Tung-Che Liang
Observation Point Insertion Using Deep Learning. ICCAD (2022)
Asif Mirza, Amin Shafiee, Sanmitra Banerjee, Krishnendu Chakrabarty, Sudeep Pasricha, Mahdi Nikdast
Characterization and Optimization of Integrated Silicon-Photonic Neural Networks under Fabrication-Process Variations. CoRR (2022)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
Modeling Silicon-Photonic Neural Networks under Uncertainties. DATE (2021)
Sanmitra Banerjee, Arjun Chaudhuri, Jinwoo Kim, Gauthaman Murali, Mark Nelson, Sung Kyu Lim, Krishnendu Chakrabarty
ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs. ICCAD (2021)
Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty
Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. DATE (2021)
Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty
Pruning Coherent Integrated Photonic Neural Networks Using the Lottery Ticket Hypothesis. CoRR (2021)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
Optimizing Coherent Integrated Photonic Neural Networks under Random Uncertainties. OFC (2021)
Sanmitra Banerjee, Mahdi Nikdast, Sudeep Pasricha, Krishnendu Chakrabarty
CHAMP: Coherent Hardware-Aware Magnitude Pruning of Integrated Photonic Neural Networks. CoRR (2021)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
Optimizing Coherent Integrated Photonic Neural Networks under Random Uncertainties. CoRR (2021)
Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. Very Large Scale Integr. Syst. 29 (2) (2021)
Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Jinwoo Kim, Gauthaman Murali, Edward Lee, Daehyun Kim, Sung Kyu Lim, Saibal Mukhopadhyay, Krishnendu Chakrabarty
Advances in Design and Test of Monolithic 3-D ICs. IEEE Des. Test 37 (4) (2020)
Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty
Modeling Silicon-Photonic Neural Networks under Uncertainties. CoRR (2020)
Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
. ATS (2020)
Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs. IEEE Trans. Very Large Scale Integr. Syst. 28 (6) (2020)
Jinwoo Kim, Gauthaman Murali, Pruek Vanna-Iampikul, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Saibal Mukhopadhyay, Sung Kyu Lim
RTL-to-GDS Design Tools for Monolithic 3D ICs. ICCAD (2020)
Heechun Park, Kyungwook Chang, Bon Woong Ku, Jinwoo Kim, Edward Lee, Daehyun Kim, Arjun Chaudhuri, Sanmitra Banerjee, Saibal Mukhopadhyay, Krishnendu Chakrabarty, Sung Kyu Lim
RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs. DAC (2019)
Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim
Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs. ETS (2019)
Madhusudhan Mishra, Sawon Pratiher, Sanmitra Banerjee, Anirban Mukherjee
Grading heart sounds through variational mode decomposition and higher order spectral features. I2MTC (2018)
Madhusudhan Mishra, Sanmitra Banerjee, Dennis C. Thomas, Sagnik Dutta, Anirban Mukherjee
Detection of Third Heart Sound Using Variational Mode Decomposition. IEEE Trans. Instrum. Meas. 67 (7) (2018)