Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs.
Arjun ChaudhuriSanmitra BanerjeeJinwoo KimHeechun ParkBon Woong KuSukeshwar KannanKrishnendu ChakrabartySung Kyu LimPublished in: ACM J. Emerg. Technol. Comput. Syst. (2022)