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Design Automation and Test Solutions for Monolithic 3D ICs.
Lingjun Zhu
Arjun Chaudhuri
Sanmitra Banerjee
Gauthaman Murali
Pruek Vanna-Iampikul
Krishnendu Chakrabarty
Sung Kyu Lim
Published in:
ACM J. Emerg. Technol. Comput. Syst. (2022)
Keyphrases
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design automation
test generation
circuit design
test cases
computer vision
data sets
machine learning
database systems
optimal solution
image analysis
test data
benchmark problems
statistical tests