Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits.
Sanmitra BanerjeeArjun ChaudhuriShao-Chun HungKrishnendu ChakrabartyPublished in: DATE (2021)
Keyphrases
- integrated circuit
- built in self test
- test cases
- statistical tests
- hardware software co design
- building blocks
- experimental design
- case study
- test suite
- software testing
- printed circuit boards
- massively parallel
- test data generation
- test generation
- design parameters
- design space
- design decisions
- recent advances
- image analysis
- user interface