DESIGN PARAMETERS
Experts
- Jonna Häkkilä
- Kim Halskov
- Jean Vanderdonckt
- Stephen R. Duncan
- Masayuki Sato
- Katie Shilton
- Makoto Ikeda
- Huai-Ning Wu
- Yao-Wen Chang
- Ashley Colley
- Kunihiro Asada
- Florian Alt
- Satoshi Komatsu
- Wisama Khalil
- Robert A. Walker
- Albrecht Schmidt
- Shao-Yun Fang
- Ulrich Rüde
- Dimitrios M. Thilikos
- Rimon Ikeno
- Bastian Pfleging
- Benjamin Bach
- Tetsuya Iizuka
- Takashi Maruyama
- Matthias Markl
- Yong-Lae Park
- Vadim Tynchenko
- Aaron Sloman
- Idris Kempf
- Carolin Körner
- Stephen A. Blythe
- Sergei Kurashkin
- Paul J. Goulart
- Regina Ammer
- Michael A. Demetriou
- Jun-Wei Wang
- Krishnendu Chakrabarty
- Arne Berger
- Karon E. MacLean
Venues
- CoRR
- Sensors
- IEEE Access
- CDC
- CHI
- ICRA
- Microelectron. Reliab.
- NEMS
- CHI Extended Abstracts
- ACC
- Microelectron. J.
- IEEE Trans. Ind. Electron.
- IEEE Robotics Autom. Lett.
- Qual. Reliab. Eng. Int.
- EMBC
- IEEE Trans. Instrum. Meas.
- IROS
- Conference on Designing Interactive Systems
- IEEE Trans. Circuits Syst. II Express Briefs
- ISCAS
- IBM J. Res. Dev.
- Autom.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ECC
- IEICE Trans. Electron.
- DAC
- Proc. IEEE
- Comput. Chem. Eng.
- DATE
- Artif. Intell. Eng. Des. Anal. Manuf.
- ICECS
- ITC
- Appl. Math. Comput.
- RoboSoft
- IEEE Trans. Vis. Comput. Graph.
- J. Comb. Theory, Ser. A
- Proc. ACM Hum. Comput. Interact.
- Technometrics
- ACM Great Lakes Symposium on VLSI
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