DESIGN PARAMETERS
Experts
- Jonna Häkkilä
- Kim Halskov
- Stephen R. Duncan
- Jean Vanderdonckt
- Masayuki Sato
- Makoto Ikeda
- Florian Alt
- Ashley Colley
- Yao-Wen Chang
- Katie Shilton
- Huai-Ning Wu
- Kunihiro Asada
- Benjamin Bach
- Robert A. Walker
- Shao-Yun Fang
- Paul J. Goulart
- Albrecht Schmidt
- Matthias Markl
- Sergei Kurashkin
- Michael A. Demetriou
- Aaron Sloman
- Bastian Pfleging
- Vadim Tynchenko
- Dimitrios M. Thilikos
- Tetsuya Iizuka
- Satoshi Komatsu
- Idris Kempf
- Rimon Ikeno
- Wisama Khalil
- Regina Ammer
- Stephen A. Blythe
- Yong-Lae Park
- Ulrich Rüde
- Takashi Maruyama
- Carolin Körner
- Hiroshi Umeo
- Maurizio Ciampa
- Martin Kucera
- Arne Berger
Venues
- CoRR
- Sensors
- IEEE Access
- CDC
- CHI
- ICRA
- Microelectron. Reliab.
- NEMS
- CHI Extended Abstracts
- ACC
- Microelectron. J.
- IEEE Robotics Autom. Lett.
- IEEE Trans. Ind. Electron.
- IEEE Trans. Instrum. Meas.
- Qual. Reliab. Eng. Int.
- EMBC
- IROS
- Conference on Designing Interactive Systems
- IBM J. Res. Dev.
- Autom.
- ISCAS
- IEEE Trans. Circuits Syst. II Express Briefs
- ECC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DATE
- Comput. Chem. Eng.
- IEICE Trans. Electron.
- DAC
- Proc. IEEE
- Appl. Math. Comput.
- Artif. Intell. Eng. Des. Anal. Manuf.
- IEEE Trans. Vis. Comput. Graph.
- ITC
- RoboSoft
- ICECS
- ACM Great Lakes Symposium on VLSI
- Proc. ACM Hum. Comput. Interact.
- J. Comb. Theory, Ser. A
- Technometrics
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