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Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs.
Sanmitra Banerjee
Arjun Chaudhuri
Krishnendu Chakrabarty
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
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manufacturing process
information systems
product quality
real world
manufacturing systems
search algorithm
defect classification
manufacturing processes
production line
quality control
process model
multiscale
similarity measure
image segmentation
image processing
computer vision
social networks