MANUFACTURING PROCESS
Experts
- MengChu Zhou
- Hesuan Hu
- Paulo Leitão
- Romeo Ortega
- George Q. Huang
- Birgit Vogel-Heuser
- José Guadalupe Romero
- Ye-Hwa Chen
- José Barata
- Andrea Matta
- Damien Trentesaux
- Jingshan Li
- Reza Tavakkoli-Moghaddam
- Jacquelien M. A. Scherpen
- Dawn M. Tilbury
- Jean-Pierre Kenné
- Jose L. Martinez Lastra
- Yihai He
- Andrew Kusiak
- Alejandro Donaire
- Lei Wang
- Andrew Y. C. Nee
- Keyi Xing
- Pingyu Jiang
- Fei Tao
- Michael Weyrich
- Weiming Shen
- Valeriy Vyatkin
- John W. Fowler
- Glen Bright
- Francesco Martinelli
- Robert Harrison
- Han Zhao
- Alexandre Dolgui
- Ali Gharbi
- Kira Barton
- Panagiotis D. Christofides
- Thorsten Wuest
- Naiqi Wu
Venues
- WSC
- CoRR
- Int. J. Comput. Integr. Manuf.
- J. Intell. Manuf.
- Comput. Ind. Eng.
- Int. J. Prod. Res.
- Comput. Chem. Eng.
- Sensors
- ICRA
- ETFA
- IEEE Access
- CASE
- Eur. J. Oper. Res.
- ACC
- SMC
- Comput. Ind.
- Expert Syst. Appl.
- CDC
- Int. J. Manuf. Technol. Manag.
- Int. J. Autom. Technol.
- IEEM
- IEEE Trans. Autom. Control.
- Autom.
- IGARSS
- APMS (1)
- Adv. Eng. Informatics
- Remote. Sens.
- IEEE Trans Autom. Sci. Eng.
- ECC
- Oper. Res.
- Comput. Aided Des.
- Microelectron. Reliab.
- APMS (2)
- IEEE Trans. Engineering Management
- Prod. Eng.
- ITC
- PLM
- SOHOMA
- IROS
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